| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A hybrid active optical system for wave front preservation and variable focal distance
|
Cocco, Daniele
|
|
2010
|
616 |
2-3 |
p. 128-133
6 p.
|
artikel
|
| 2 |
An investigation of differential deposition for figure corrections in full-shell grazing-incidence X-ray optics
|
Gubarev, M.V.
|
|
2010
|
616 |
2-3 |
p. 273-276
4 p.
|
artikel
|
| 3 |
An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors
|
Polack, François
|
|
2010
|
616 |
2-3 |
p. 207-211
5 p.
|
artikel
|
| 4 |
A preferential coating technique for fabricating large, high quality optics
|
Alcock, S.G.
|
|
2010
|
616 |
2-3 |
p. 110-114
5 p.
|
artikel
|
| 5 |
A stitching figure profiler of large X-ray mirrors using RADSI for subaperture data acquisition
|
Kimura, Takashi
|
|
2010
|
616 |
2-3 |
p. 229-232
4 p.
|
artikel
|
| 6 |
Author Index
|
|
|
2010
|
616 |
2-3 |
p. 285-288
4 p.
|
artikel
|
| 7 |
Autocollimators for deflectometry: Current status and future progress
|
Geckeler, Ralf D.
|
|
2010
|
616 |
2-3 |
p. 140-146
7 p.
|
artikel
|
| 8 |
Binary pseudo-random gratings and arrays for calibration of modulation transfer functions of surface profilometers
|
Barber, Samuel K.
|
|
2010
|
616 |
2-3 |
p. 172-182
11 p.
|
artikel
|
| 9 |
Characterization and calibration of 2nd generation slope measuring profiler
|
Siewert, Frank
|
|
2010
|
616 |
2-3 |
p. 119-127
9 p.
|
artikel
|
| 10 |
Concept, design and capability analysis of the new Deflectometric Flatness Reference at PTB
|
Schulz, M.
|
|
2010
|
616 |
2-3 |
p. 134-139
6 p.
|
artikel
|
| 11 |
Curved graded multilayers for X-ray nano-focusing optics
|
Morawe, Ch.
|
|
2010
|
616 |
2-3 |
p. 98-104
7 p.
|
artikel
|
| 12 |
Evolution of surface roughness in silicon X-ray mirrors exposed to a low-energy ion beam
|
Ziegler, E.
|
|
2010
|
616 |
2-3 |
p. 188-192
5 p.
|
artikel
|
| 13 |
Extended knife-edge method for characterizing sub-10-nm X-ray beams
|
Handa, Soichiro
|
|
2010
|
616 |
2-3 |
p. 246-250
5 p.
|
artikel
|
| 14 |
Fabrication of damage-free Johansson-type doubly curved crystal spectrometer substrate by numerically controlled local wet etching
|
Yamamura, K.
|
|
2010
|
616 |
2-3 |
p. 281-284
4 p.
|
artikel
|
| 15 |
Fabrication of X-ray mirrors for synchrotron applications
|
Thiess, H.
|
|
2010
|
616 |
2-3 |
p. 157-161
5 p.
|
artikel
|
| 16 |
Hard X-ray nanoprobe at beamline P06 at PETRA III
|
Schroer, Christian G.
|
|
2010
|
616 |
2-3 |
p. 93-97
5 p.
|
artikel
|
| 17 |
High-reflectivity (m=4) elliptical neutron focusing supermirror fabricated by numerically controlled local wet etching with ion beam sputter deposition
|
Yamamura, K.
|
|
2010
|
616 |
2-3 |
p. 193-196
4 p.
|
artikel
|
| 18 |
Inside front cover (Editorial Board)
|
|
|
2010
|
616 |
2-3 |
p. IFC-
1 p.
|
artikel
|
| 19 |
In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation
|
Thomasset, Muriel
|
|
2010
|
616 |
2-3 |
p. 197-202
6 p.
|
artikel
|
| 20 |
Ion beam profiling of aspherical X-ray mirrors
|
Peverini, L.
|
|
2010
|
616 |
2-3 |
p. 115-118
4 p.
|
artikel
|
| 21 |
Metrology of multilayer Laue lens structures by means of scanning electron microscope imaging
|
Jahedi, N.
|
|
2010
|
616 |
2-3 |
p. 89-92
4 p.
|
artikel
|
| 22 |
Micro-stitching interferometry at the ESRF
|
Rommeveaux, Amparo
|
|
2010
|
616 |
2-3 |
p. 183-187
5 p.
|
artikel
|
| 23 |
New X-ray microprobe system for trace heavy element analysis using ultraprecise X-ray mirror optics of long working distance
|
Terada, Yasuko
|
|
2010
|
616 |
2-3 |
p. 270-272
3 p.
|
artikel
|
| 24 |
One-dimensional surface profile retrieval from grazing incidence images under coherent X-ray illumination
|
Suvorov, A.
|
|
2010
|
616 |
2-3 |
p. 277-280
4 p.
|
artikel
|
| 25 |
Preface
|
|
|
2010
|
616 |
2-3 |
p. vii-
1 p.
|
artikel
|
| 26 |
Ray-tracing analysis in aberration of a laterally- graded multilayer mirror
|
Mimura, Hidekazu
|
|
2010
|
616 |
2-3 |
p. 251-254
4 p.
|
artikel
|
| 27 |
Simulation study of four-mirror alignment of advanced Kirkpatrick−Baez optics
|
Matsuyama, S.
|
|
2010
|
616 |
2-3 |
p. 241-245
5 p.
|
artikel
|
| 28 |
Spherical concave mirror measurement by phase-shifting point diffraction interferometer with two optical fibers
|
Matsuura, Toshiaki
|
|
2010
|
616 |
2-3 |
p. 233-236
4 p.
|
artikel
|
| 29 |
Stitching-angle measurable microscopic-interferometer: Surface-figure metrology tool for hard X-ray nanofocusing mirrors with large curvature
|
Yumoto, Hirokatsu
|
|
2010
|
616 |
2-3 |
p. 203-206
4 p.
|
artikel
|
| 30 |
Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler
|
Yashchuk, Valeriy V.
|
|
2010
|
616 |
2-3 |
p. 212-223
12 p.
|
artikel
|
| 31 |
The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability
|
Alcock, S.G.
|
|
2010
|
616 |
2-3 |
p. 224-228
5 p.
|
artikel
|
| 32 |
Three-dimensional X-ray fluorescence imaging with confocal full-field X-ray microscope
|
Takeuchi, Akihisa
|
|
2010
|
616 |
2-3 |
p. 261-265
5 p.
|
artikel
|
| 33 |
Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle
|
Takahashi, Yukio
|
|
2010
|
616 |
2-3 |
p. 266-269
4 p.
|
artikel
|
| 34 |
Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook
|
Arnold, T.
|
|
2010
|
616 |
2-3 |
p. 147-156
10 p.
|
artikel
|
| 35 |
Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8
|
Senba, Y.
|
|
2010
|
616 |
2-3 |
p. 237-240
4 p.
|
artikel
|
| 36 |
X-ray active mirror coupled with a Hartmann wavefront sensor
|
Idir, Mourad
|
|
2010
|
616 |
2-3 |
p. 162-171
10 p.
|
artikel
|
| 37 |
X-ray digital wavefront sensor development
|
Idir, Mourad
|
|
2010
|
616 |
2-3 |
p. 255-260
6 p.
|
artikel
|
| 38 |
X-ray nanofocusing with back diffracting bent crystal
|
Suvorov, A.
|
|
2010
|
616 |
2-3 |
p. 105-109
5 p.
|
artikel
|
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