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Details for article 33 of 38 found articles
| Title: |
Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle |
| Author: |
Takahashi, Yukio Kubo, Hideto Tsutsumi, Ryosuke Sakaki, Shigeyuki Zettsu, Nobuyuki Nishino, Yoshinori Ishikawa, Tetsuya Yamauchi, Kazuto |
| Appeared in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
| Paging: | Volume 616 (2010) nr. 2-3 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 33 of 38 found articles
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