| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A class of fault-tolerant multiprocessor networks
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 2 |
A complex priority redundant system with phase type distribution
|
Gururajan, M.
|
|
1990
|
30 |
3 |
p. 453-455
|
artikel
|
| 3 |
A corollary to: Duane's postulate on reliability growth
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 4 |
A framework for knowledge-based computer-integrated manufacturing
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 5 |
Ageing effects in GaAs Schottky barrier diodes
|
|
|
1990
|
30 |
3 |
p. 616-617
|
artikel
|
| 6 |
A method for generating weighted random test patterns
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 7 |
An altered layer model for ion assisted deposition under net growth conditions
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 8 |
Analysis of aluminum gallium arsenide laser diodes failing due to nonradiative regions behind the facets
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 9 |
Analysis of a protective system having two types of failure
|
Singh, S.K.
|
|
1990
|
30 |
3 |
p. 473-480
|
artikel
|
| 10 |
A new concept in reliability modelling
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 11 |
A new reliability problem associated with Ar ion sputter cleaning of interconnect vias
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 12 |
An expert system to facilitate fault isolation
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 13 |
An investigation of the time dependence of current degradation in MOS devices
|
|
|
1990
|
30 |
3 |
p. 615-616
|
artikel
|
| 14 |
A note on experiment design for accelerated life tests
|
Luvalle, M.J.
|
|
1990
|
30 |
3 |
p. 591-603
|
artikel
|
| 15 |
A performance measure for a VHSIC avionic system: mission dependent availability
|
|
|
1990
|
30 |
3 |
p. 613
|
artikel
|
| 16 |
Application-specific integrated circuits (ASICs)—a main-stream line of VLSI device fabrication
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 17 |
Applied electromagnetics in materials
|
G.W.A.D.,
|
|
1990
|
30 |
3 |
p. 609-610
|
artikel
|
| 18 |
Approximate availability analysis of VAXcluster systems
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 19 |
A reliability model for total field incidents
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 20 |
A study of the breakdown testing of thermal silicon oxides and the effects of preoxidation surface treatment
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 21 |
A study of the majority carrier mobility in hydrogenated boron-doped silicon
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 22 |
A theoretical derivation of the log-normal distribution of time-dependent dielectric breakdown in thin oxides
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 23 |
Availability measures of human-equipment standby redundant data-flow system with application to NASA deep space station
|
Issa, Tareq N.
|
|
1990
|
30 |
3 |
p. 573-583
|
artikel
|
| 24 |
Bellcore system hardware reliability prediction
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 25 |
BiCMOS circuitry: the best of both worlds
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 26 |
Built-in test strategies for military systems
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 27 |
Chip type aluminum electrolytic capacitors feature SMT-compatibility, low profiles
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 28 |
4847838 Circuit for testing the bus structure of a printed wiring card
|
Kralik, Ivan
|
|
1990
|
30 |
3 |
p. ii
|
artikel
|
| 29 |
Component failures based on flow distributions
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 30 |
Compound availability measures for a two-unit standby system
|
Kapur, P.K.
|
|
1990
|
30 |
3 |
p. 425-429
|
artikel
|
| 31 |
Cost analysis of a multi-component screening system in the paper industry
|
Kumar, Dinesh
|
|
1990
|
30 |
3 |
p. 457-461
|
artikel
|
| 32 |
Cost-effective software safety analysis
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 33 |
Design of a self-reconfiguring interconnection network for fault-tolerant VLSI processor arrays
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 34 |
Development of a generic database for CAE/CAD/CAM system at an Air Force facility
|
Sherif, Yosef S.
|
|
1990
|
30 |
3 |
p. 555-564
|
artikel
|
| 35 |
Development of a new composite pseudo random number generator
|
Sherif, Yosef S.
|
|
1990
|
30 |
3 |
p. 545-553
|
artikel
|
| 36 |
Dynamic analyses in mass spectrometry of SF 6 plasma during etching of silicon
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 37 |
Economic reliability testing of fiber optic systems
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 38 |
Effect of argon implantation on antimony implanted silicon
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 39 |
Effect of mechanical stress for thin SiO 2 films in TDDB and CCST characteristics
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 40 |
Effects of copper and titanium addition to aluminum interconnects on electro- and stress-migration open circuit failures
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 41 |
Environmental stress screening: an integration of disciplines
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 42 |
ESD phenomena in graded junction devices
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 43 |
Estimated costs of system maintenance and repair
|
Sultan, Torky I.
|
|
1990
|
30 |
3 |
p. 515-518
|
artikel
|
| 44 |
Excess repair time for a repairable system
|
Agrafiotis, G.K.
|
|
1990
|
30 |
3 |
p. 507-509
|
artikel
|
| 45 |
Extensions of the effective thickness theory of oxide breakdown
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 46 |
Fact and fiction in yield modeling
|
|
|
1990
|
30 |
3 |
p. 623-624
|
artikel
|
| 47 |
Filmless, sealed super-small chip trimmer potentiometers take on new importance
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 48 |
4845425 Full chip integrated circuit tester
|
Beha, Johannes G
|
|
1990
|
30 |
3 |
p. i
|
artikel
|
| 49 |
HAST applications: acceleration factors and results for VLSI components
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 50 |
Heterostructure semiconductor device analysis: a globally convergent solution method for the nonlinear Poisson equation
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 51 |
High-performance optics—fundamental constituent of equipment for VLSI circuit fabrication
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 52 |
High reliability in the commercial arena
|
|
|
1990
|
30 |
3 |
p. 613
|
artikel
|
| 53 |
Hill-climbing heuristics for optimal hardware dimensioning and software allocation in fault-tolerant distributed systems
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 54 |
Human contamination as a source of IC failures
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 55 |
Impact of new technology on repair
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 56 |
Integrated reliability growth testing
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 57 |
Integration of reliability—and tolerance effect analysis
|
|
|
1990
|
30 |
3 |
p. 619-620
|
artikel
|
| 58 |
Interface degradation and dielectric breakdown of thin oxides due to homogeneous charge injection
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 59 |
Interface state generation due to electron tunneling into thin oxides
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 60 |
Into the nineties: VLSI trends and education
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 61 |
Invariant permutations for consecutive k-out-of-n cycles
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 62 |
Ion-implanted-induced structural modifications in Y 1Ba 2Cu 3O 7−δ superconductor
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 63 |
Large-area fault clusters and fault tolerance in VLSI circuits: a review
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 64 |
Legal liability and system safety applied to expert systems
|
|
|
1990
|
30 |
3 |
p. 614-615
|
artikel
|
| 65 |
Lithography in microelectronics
|
G.W.A.D.,
|
|
1990
|
30 |
3 |
p. 606
|
artikel
|
| 66 |
Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 67 |
Management method for LSI wafer fabrication facilities
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 68 |
Managing Murphy's law: engineering a minimum-risk system
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 69 |
Mechanical durability prediction methods
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 70 |
4847810 Memory having redundancy circuit
|
Tagami, Tomoyuki
|
|
1990
|
30 |
3 |
p. ii
|
artikel
|
| 71 |
Modeling and analysis of systems with multimode components and dependent failures
|
|
|
1990
|
30 |
3 |
p. 618-619
|
artikel
|
| 72 |
Modeling server-unreliability in closed queuing networks
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 73 |
Models and algorithms for reliability-oriented task-allocation in redundant distributed-computer systems
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 74 |
Monte Carlo evaluation of a dynamic reliability problem with an application to a case of partial cuts
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 75 |
Motivating reliable switching system performance
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 76 |
MTSF and availability analysis of a complex system composed of two subsystems in series subjected to random shocks with single repair facility
|
Singh Joorel, J.P.
|
|
1990
|
30 |
3 |
p. 463-466
|
artikel
|
| 77 |
Multiplexing input options of VLSI circuits implemented in four-phase dynamic logic technology
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 78 |
Natural language processing technologies in artificial intelligence: The science and industry perspective
|
Popentiu, Florin
|
|
1990
|
30 |
3 |
p. 610-611
|
artikel
|
| 79 |
4847553 Needle card contacting mechanism for testing micro-electronic components
|
Seinecke, Siegfried
|
|
1990
|
30 |
3 |
p. i
|
artikel
|
| 80 |
New anatomies for semiconductor wafers
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 81 |
New applications of focused ion beam technique to failure analysis and process monitoring of VLSI
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 82 |
New effects resulting from the co-operation between process engineering and equipment design in IC fabrication
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 83 |
Noise and lifetime measurements in Si p +-i-n power diodes
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 84 |
Nonplanar VLSI arrays with high fault-tolerance capabilities
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 85 |
Observation of coherent Zener tunneling in Si inversion layers
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 86 |
On-chip measurement of package-related metal shift using an integrated silicon sensor
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 87 |
Operability and maintainability hazards in communications systems
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 88 |
Overheating effects in metallic point contacts
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 89 |
Parallelization of expert systems with recursive applications
|
Yaprak, E.
|
|
1990
|
30 |
3 |
p. 519-523
|
artikel
|
| 90 |
Particles on surfaces volume 1 detection, adhesion, and removal
|
G.W.A.D.,
|
|
1990
|
30 |
3 |
p. 608
|
artikel
|
| 91 |
Performance analysis of fault-tolerant systems in parallel execution of conversations
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 92 |
Performance control of systems with two decisive factors
|
Sultan, Torky I.
|
|
1990
|
30 |
3 |
p. 511-514
|
artikel
|
| 93 |
Periodic replacement when minimal repair costs depend on the age and the number of minimal repair for a multi-unit system
|
Sheu, Shey-Huei
|
|
1990
|
30 |
3 |
p. 565-572
|
artikel
|
| 94 |
Photoluminescence of the residual shallow acceptor in In xGa 1 − x grown on GaAs (001) by molecular beam epitaxy
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 95 |
p-MOSFET gate current and device degradation
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 96 |
Polarity dependence of thin oxide wearout
|
|
|
1990
|
30 |
3 |
p. 626-627
|
artikel
|
| 97 |
Prediction for system reliability and availability
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 98 |
Probabilistic analysis of a two-unit system with ‘start-up process time’ and imperfect switch
|
Sarma, Yadavalli V.S.
|
|
1990
|
30 |
3 |
p. 537-543
|
artikel
|
| 99 |
Process optimization tweaking tool (POTT) and its application in controlling oxidation thickness
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 100 |
Publications, notices, calls for papers, etc.
|
|
|
1990
|
30 |
3 |
p. 421-423
|
artikel
|
| 101 |
Pulsed laser deposition of barium titanate films on silicon
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 102 |
Qualification of high reliability medical grade batteries
|
|
|
1990
|
30 |
3 |
p. 615
|
artikel
|
| 103 |
Redundancy strategy for dependent subsystems
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 104 |
Reliability analysis of a class of fault tolerant systems
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 105 |
Reliability analysis of a k-out-of-N:G parallel redundant system with multiple critical errors
|
Kee Chung, Who
|
|
1990
|
30 |
3 |
p. 585-589
|
artikel
|
| 106 |
Reliability analysis of a two-unit parallel system with dissimilar units and general distributions
|
Vanderperre, E.J.
|
|
1990
|
30 |
3 |
p. 491-501
|
artikel
|
| 107 |
Reliability analysis of a warm standby system with general distributions
|
Vanderperre, E.J.
|
|
1990
|
30 |
3 |
p. 487-490
|
artikel
|
| 108 |
Reliability analysis of interconnection networks using hierarchical composition
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 109 |
Reliability analysis of redundant-path interconnection networks
|
|
|
1990
|
30 |
3 |
p. 618
|
artikel
|
| 110 |
Reliability computation of multistage interconnection networks
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 111 |
Reliability database development for use with an object-oriented fault tree evaluation program
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 112 |
Reliability evaluation of hypercube multicomputers
|
|
|
1990
|
30 |
3 |
p. 617-618
|
artikel
|
| 113 |
Reliability fundamentals
|
Popentiu, Florin
|
|
1990
|
30 |
3 |
p. 605-606
|
artikel
|
| 114 |
Reliability issues with multiprocessor distributed database systems: a case study
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 115 |
Reliability models for mechanical equipment
|
|
|
1990
|
30 |
3 |
p. 613
|
artikel
|
| 116 |
Reliability testing of a software-driven system
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 117 |
Repair actions for self-diagnostic machines
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 118 |
R&M through avionics/electronics integrity program
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 119 |
Robust testing of CMOS logic circuits
|
|
|
1990
|
30 |
3 |
p. 621
|
artikel
|
| 120 |
Silicon-hydrogen bonds and microvoids in hydrogenated amorphous silicon and Staebler-Wronski effect
|
|
|
1990
|
30 |
3 |
p. 625
|
artikel
|
| 121 |
Si/Ti/TiB 2/Al structures investigated as contacts in microelectronic devices
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 122 |
Small-area fault clusters and fault tolerance in VLSI circuits
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 123 |
Smart power and high voltage integrated circuits and related MOS technologies
|
|
|
1990
|
30 |
3 |
p. 623
|
artikel
|
| 124 |
Software reliability and redundancy optimization
|
|
|
1990
|
30 |
3 |
p. 619
|
artikel
|
| 125 |
Software reliability from a system perspective
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 126 |
Software reliability growth process—a life cycle approach
|
|
|
1990
|
30 |
3 |
p. 620-621
|
artikel
|
| 127 |
SPAREL: a model for reliability and sparing in the world of redundancies
|
|
|
1990
|
30 |
3 |
p. 620
|
artikel
|
| 128 |
Stacking fault growth of f.c.c. crystal: the Monte-Carlo simulation approach
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 129 |
Star-delta transformations of bidirectional branches in probabilistic flow networks
|
Rushdi, Ali M.
|
|
1990
|
30 |
3 |
p. 525-535
|
artikel
|
| 130 |
Storage reliability
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 131 |
Study of bandgap narrowing in the space-charge region of heavily doped silicon MOS capacitors
|
|
|
1990
|
30 |
3 |
p. 625-626
|
artikel
|
| 132 |
Survey of available software-safety analysis techniques
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
|
| 133 |
4845426 Temperature conditioner for tests of unpackaged semiconductors
|
Nolan, Charles
|
|
1990
|
30 |
3 |
p. i
|
artikel
|
| 134 |
Temperature dependence of the conductivity in uniaxially stressed Si inversion layers at low temperatures
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 135 |
Testing equality of means in a bivariate normal population under possible presence of correlation coefficient
|
Srivastava, C.P.L.
|
|
1990
|
30 |
3 |
p. 467-471
|
artikel
|
| 136 |
The alternate approach to the reliability modeling of fault masking systems
|
Biernat, Janusz
|
|
1990
|
30 |
3 |
p. 503-506
|
artikel
|
| 137 |
The cost of poor repair process quality (COPRPQ)
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 138 |
The growth and characterization of ZnSe epilayers grown by VPE and MOCVD
|
|
|
1990
|
30 |
3 |
p. 627
|
artikel
|
| 139 |
The “hedgehog” shape of an ESD failure
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 140 |
The limit condition of some time between failure models of software reliability
|
Xizi, Huang
|
|
1990
|
30 |
3 |
p. 481-485
|
artikel
|
| 141 |
The numbers game with the logistics support analysis record (LSAR)
|
|
|
1990
|
30 |
3 |
p. 614
|
artikel
|
| 142 |
The passivation of silicon devices by a-Si:H films
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 143 |
Thought-provoking gems from my reliability experience
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|
|
1990
|
30 |
3 |
p. 613-614
|
artikel
|
| 144 |
Three-dimensional integrated circuit: technology and application prospect
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 145 |
Three-dimensional process and device modeling
|
|
|
1990
|
30 |
3 |
p. 624
|
artikel
|
| 146 |
Time-dependent dielectric breakdown of 210Åoxides
|
|
|
1990
|
30 |
3 |
p. 616
|
artikel
|
| 147 |
Trends in semiconductor memories
|
|
|
1990
|
30 |
3 |
p. 622-623
|
artikel
|
| 148 |
Two models for two-dissimilar-unit cold standby redundant system with partial failure and two types of repairs
|
Mokaddis, G.S.
|
|
1990
|
30 |
3 |
p. 431-451
|
artikel
|
| 149 |
Ultrahigh reliability estimates through simulation
|
|
|
1990
|
30 |
3 |
p. 622
|
artikel
|
| 150 |
VLSI electronics microstructure science volume 21 beam processing technologies
|
G.W.A.D.,
|
|
1990
|
30 |
3 |
p. 607
|
artikel
|
| 151 |
Voltage shifts of Fowler-Nordheim tunneling J-V plots in thin gate oxide MOS structures due to trapped charges
|
|
|
1990
|
30 |
3 |
p. 626
|
artikel
|
| 152 |
Warranties: concept to implementation
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|
|
1990
|
30 |
3 |
p. 613
|
artikel
|
| 153 |
Why there is a need for a software-safety program
|
|
|
1990
|
30 |
3 |
p. 617
|
artikel
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