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                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A comprehensive study of negative bias temperature instability in MOS structures Irrera, Fernanda

155 C p.
artikel
2 A novel approach of fatigue testing and evaluation of electronic systems based on phase tracking Doranga, Sushil

155 C p.
artikel
3 A screening method of retired insulated gate bipolar transistor for reuse based on multiple indicators and integrated model Liu, He

155 C p.
artikel
4 A theoretical investigation of mole fraction-based N + pocket doped stack oxide TFET considering ideal conditions for reliability issues Nigam, Kaushal Kumar

155 C p.
artikel
5 Bayesian calibration of ball grid array lifetime models for solder fatigue Tauscher, Markus

155 C p.
artikel
6 Boosting the thermal stability of paralleled GaAs HBTs through temperature-dependent ballasting resistors: A proof-of-concept study Catalano, Antonio Pio

155 C p.
artikel
7 Breakdown voltage and TDDB performance improvement by optimizing the PECVD dielectric film characteristics in MIM capacitors Wu, Huihui

155 C p.
artikel
8 Cost-effective reliability enhancement for video stitching applications based on error-tolerance Hsieh, Tong-Yu

155 C p.
artikel
9 Crosstalk optimization and gate oxide reliability analysis in intercalation doped MLGNR with reduced vertical thickness Wu, Qixiao

155 C p.
artikel
10 Dynamic wetting and spreading mechanisms of SAC305 with added Au elements in the laser jet weld ball bonding process Guo, Liwei

155 C p.
artikel
11 Editorial Board
155 C p.
artikel
12 Experimental and numerical investigation on reliability of encapsulated sine wave interconnect for stretchable substrates Patidar, Deepesh

155 C p.
artikel
13 Failure analysis on the abnormal cracking of Si3N4 ceramic substrates for SiC power modules in new energy vehicles Chen, Jie

155 C p.
artikel
14 Fault tolerant micro-programmed control unit for SEU and MBU mitigation in space based digital systems S., Deepanjali

155 C p.
artikel
15 Field-plated and back-barrier engineered wide-bandgap III-nitride/β-Ga2O3 nano-HEMT for emerging RF/microwave micro/nanoelectronics applications Rao, G. Purnachandra

155 C p.
artikel
16 Impact of SiC power MOSFET interface trap charges on UIS reliability under single pulse Wu, Xiao-Dong

155 C p.
artikel
17 Interface stress analysis and bonding strengthening exploration of metal layer on the laser-activated copper-clad AlN Shao, Jing

155 C p.
artikel
18 Investigation of safe operating area and behavior of unclamped inductive switching on 4H-SiC VDMOSFET Ke, Chao-Yang

155 C p.
artikel
19 Numerical investigation of solder joint shape for micro-spring package during vacuum vapor phase soldering Li, Xiaomin

155 C p.
artikel
20 Research progress of hybrid bonding technology for three-dimensional integration Zhou, Anqi

155 C p.
artikel
21 Sensitivity study of super-junction power MOSFETs by spatial and depth resolved heavy ion SEE mapping with various bias, LETs and ion ranges Gerold, M.

155 C p.
artikel
22 Software countermeasures against the multiple instructions skip fault model Khuat, Vanthanh

155 C p.
artikel
23 Study on the effect of anti-oxidation film formed by composite system on solder balls performance Wang, Tongju

155 C p.
artikel
24 Testing and simulation of lifetime for wire bond interconnections with varying bond foot angle Sippel, Marcel

155 C p.
artikel
                             24 gevonden resultaten
 
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