| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification
|
M.A. El-Gamal
|
|
1999
|
14 |
3 |
p. 207-217
11 p.
|
artikel
|
| 2 |
A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification
|
El-Gamal, M.A.
|
|
1999
|
14 |
3 |
p. 207-217
|
artikel
|
| 3 |
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata
|
María José López
|
|
1999
|
14 |
3 |
p. 245-258
14 p.
|
artikel
|
| 4 |
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata
|
López, María José
|
|
1999
|
14 |
3 |
p. 245-258
|
artikel
|
| 5 |
Built-in Self Test Based on Multiple On-Chip Signature Checking
|
Mohammed Fadle Abdulla
|
|
1999
|
14 |
3 |
p. 227-244
18 p.
|
artikel
|
| 6 |
Built-in Self Test Based on Multiple On-Chip Signature Checking
|
Abdulla, Mohammed Fadle
|
|
1999
|
14 |
3 |
p. 227-244
|
artikel
|
| 7 |
Editorial
|
Vishwani D. Agrawal
|
|
1999
|
14 |
3 |
p. 187-188
2 p.
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
1999
|
14 |
3 |
p. 187-188
|
artikel
|
| 9 |
Erratum to An Algebra of Multiple Faults in RAMs
|
J.A. Brzozowski
|
|
1999
|
14 |
3 |
p. 305-306
2 p.
|
artikel
|
| 10 |
Erratum to An Algebra of Multiple Faults in RAMs
|
Brzozowski, J.A.
|
|
1999
|
14 |
3 |
p. 305-306
|
artikel
|
| 11 |
Experimental Results for Self-Dual Multi-Output Combinational Circuits
|
Vl. V. Saposhnikov
|
|
1999
|
14 |
3 |
p. 295-300
6 p.
|
artikel
|
| 12 |
Experimental Results for Self-Dual Multi-Output Combinational Circuits
|
Saposhnikov, Vl. V.
|
|
1999
|
14 |
3 |
p. 295-300
|
artikel
|
| 13 |
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs
|
Yuhai Ma
|
|
1999
|
14 |
3 |
p. 273-293
21 p.
|
artikel
|
| 14 |
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs
|
Ma, Yuhai
|
|
1999
|
14 |
3 |
p. 273-293
|
artikel
|
| 15 |
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits
|
Huy Nguyen
|
|
1999
|
14 |
3 |
p. 259-272
14 p.
|
artikel
|
| 16 |
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits
|
Nguyen, Huy
|
|
1999
|
14 |
3 |
p. 259-272
|
artikel
|
| 17 |
Testability of 2-Level AND/EXOR Circuits
|
Rolf Drechsler
|
|
1999
|
14 |
3 |
p. 219-225
7 p.
|
artikel
|
| 18 |
Testability of 2-Level AND/EXOR Circuits
|
Drechsler, Rolf
|
|
1999
|
14 |
3 |
p. 219-225
|
artikel
|
| 19 |
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
|
Rajesh Ramadoss
|
|
1999
|
14 |
3 |
p. 189-205
17 p.
|
artikel
|
| 20 |
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
|
Ramadoss, Rajesh
|
|
1999
|
14 |
3 |
p. 189-205
|
artikel
|
| 21 |
Testing of Oscillators
|
Andreas Rusznyak
|
|
1999
|
14 |
3 |
p. 301-304
4 p.
|
artikel
|
| 22 |
Testing of Oscillators
|
Rusznyak, Andreas
|
|
1999
|
14 |
3 |
p. 301-304
|
artikel
|
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