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                                       Details for article 6 of 22 found articles
 
 
  Built-in Self Test Based on Multiple On-Chip Signature Checking
 
 
Title: Built-in Self Test Based on Multiple On-Chip Signature Checking
Author: Abdulla, Mohammed Fadle
Ravikumar, C.P.
Kumar, Anshul
Appeared in: Journal of electronic testing
Paging: Volume 14 (1999) nr. 3 pages 227-244
Year: 1999
Contents:
Publisher: Kluwer Academic Publishers, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands