| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Active defects in MOS devices on 4H-SiC: A critical review
|
Amini Moghadam, Hamid
|
|
2016
|
60 |
C |
p. 1-9
9 p.
|
artikel
|
| 2 |
Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series
|
Lee, Chie-In
|
|
2016
|
60 |
C |
p. 20-24
5 p.
|
artikel
|
| 3 |
An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system
|
Liu, Dapeng
|
|
2016
|
60 |
C |
p. 109-115
7 p.
|
artikel
|
| 4 |
A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors
|
Wang, Weiliang
|
|
2016
|
60 |
C |
p. 67-69
3 p.
|
artikel
|
| 5 |
Atmospheric corrosion resistance of electroplated Ni/Ni–P/Au electronic contacts
|
Murugan, Vinod K.
|
|
2016
|
60 |
C |
p. 84-92
9 p.
|
artikel
|
| 6 |
A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors
|
Nie, Kaiming
|
|
2016
|
60 |
C |
p. 70-77
8 p.
|
artikel
|
| 7 |
Comparative study of low-frequency noise in 0.18μm and 0.35μm gate-length nMOSFETs with gate area of 1.1μm2
|
Hu, Chih-Chan
|
|
2016
|
60 |
C |
p. 10-15
6 p.
|
artikel
|
| 8 |
Damage effects on low noise amplifiers with microwave pulses
|
Zhang, Cunbo
|
|
2016
|
60 |
C |
p. 41-47
7 p.
|
artikel
|
| 9 |
Editorial Board
|
|
|
2016
|
60 |
C |
p. IFC-
1 p.
|
artikel
|
| 10 |
Effect of nano-Al2O3 reinforcement on the microstructure and reliability of Sn–3.0Ag–0.5Cu solder joints
|
Zhao, Zhenyu
|
|
2016
|
60 |
C |
p. 126-134
9 p.
|
artikel
|
| 11 |
Flux effect on void quantity and size in soldered joints
|
Bušek, D.
|
|
2016
|
60 |
C |
p. 135-140
6 p.
|
artikel
|
| 12 |
Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach
|
Rigamonti, Marco
|
|
2016
|
60 |
C |
p. 48-61
14 p.
|
artikel
|
| 13 |
Impact of NBTI induced variations on delay locked loop multi-phase clock generator
|
S.R., Sriram
|
|
2016
|
60 |
C |
p. 33-40
8 p.
|
artikel
|
| 14 |
Improvement of multicores throughput based on environmental conditions
|
Kocanda, Piotr
|
|
2016
|
60 |
C |
p. 78-83
6 p.
|
artikel
|
| 15 |
Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water
|
Wang, X.Y.
|
|
2016
|
60 |
C |
p. 101-108
8 p.
|
artikel
|
| 16 |
Integrating physical level design and high level synthesis for simultaneous multi-cycle transient and multiple transient fault resiliency of application specific datapath processors
|
Kachave, Deepak
|
|
2016
|
60 |
C |
p. 141-152
12 p.
|
artikel
|
| 17 |
KITO tool: A fault injection environment in Linux kernel data structures
|
Velasco, Alejandro David
|
|
2016
|
60 |
C |
p. 153-162
10 p.
|
artikel
|
| 18 |
La2O3 gate dielectrics for AlGaN/GaN HEMT
|
Chen, J.
|
|
2016
|
60 |
C |
p. 16-19
4 p.
|
artikel
|
| 19 |
Pulse plated silver metallization on porosified LTCC substrates for high frequency applications
|
Steinhäußer, Frank
|
|
2016
|
60 |
C |
p. 93-100
8 p.
|
artikel
|
| 20 |
Reliability modeling of Sn–Ag transient liquid phase die-bonds for high-power SiC devices
|
Bajwa, Adeel Ahmad
|
|
2016
|
60 |
C |
p. 116-125
10 p.
|
artikel
|
| 21 |
Time dependent modeling of single particle displacement damage in silicon devices
|
Tang, Du
|
|
2016
|
60 |
C |
p. 25-32
8 p.
|
artikel
|
| 22 |
Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light
|
Rutkauskas, M.
|
|
2016
|
60 |
C |
p. 62-66
5 p.
|
artikel
|
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