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                             22 results found
no title author magazine year volume issue page(s) type
1 Active defects in MOS devices on 4H-SiC: A critical review Amini Moghadam, Hamid
2016
60 C p. 1-9
9 p.
article
2 Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series Lee, Chie-In
2016
60 C p. 20-24
5 p.
article
3 An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system Liu, Dapeng
2016
60 C p. 109-115
7 p.
article
4 A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors Wang, Weiliang
2016
60 C p. 67-69
3 p.
article
5 Atmospheric corrosion resistance of electroplated Ni/Ni–P/Au electronic contacts Murugan, Vinod K.
2016
60 C p. 84-92
9 p.
article
6 A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors Nie, Kaiming
2016
60 C p. 70-77
8 p.
article
7 Comparative study of low-frequency noise in 0.18μm and 0.35μm gate-length nMOSFETs with gate area of 1.1μm2 Hu, Chih-Chan
2016
60 C p. 10-15
6 p.
article
8 Damage effects on low noise amplifiers with microwave pulses Zhang, Cunbo
2016
60 C p. 41-47
7 p.
article
9 Editorial Board 2016
60 C p. IFC-
1 p.
article
10 Effect of nano-Al2O3 reinforcement on the microstructure and reliability of Sn–3.0Ag–0.5Cu solder joints Zhao, Zhenyu
2016
60 C p. 126-134
9 p.
article
11 Flux effect on void quantity and size in soldered joints Bušek, D.
2016
60 C p. 135-140
6 p.
article
12 Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach Rigamonti, Marco
2016
60 C p. 48-61
14 p.
article
13 Impact of NBTI induced variations on delay locked loop multi-phase clock generator S.R., Sriram
2016
60 C p. 33-40
8 p.
article
14 Improvement of multicores throughput based on environmental conditions Kocanda, Piotr
2016
60 C p. 78-83
6 p.
article
15 Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water Wang, X.Y.
2016
60 C p. 101-108
8 p.
article
16 Integrating physical level design and high level synthesis for simultaneous multi-cycle transient and multiple transient fault resiliency of application specific datapath processors Kachave, Deepak
2016
60 C p. 141-152
12 p.
article
17 KITO tool: A fault injection environment in Linux kernel data structures Velasco, Alejandro David
2016
60 C p. 153-162
10 p.
article
18 La2O3 gate dielectrics for AlGaN/GaN HEMT Chen, J.
2016
60 C p. 16-19
4 p.
article
19 Pulse plated silver metallization on porosified LTCC substrates for high frequency applications Steinhäußer, Frank
2016
60 C p. 93-100
8 p.
article
20 Reliability modeling of Sn–Ag transient liquid phase die-bonds for high-power SiC devices Bajwa, Adeel Ahmad
2016
60 C p. 116-125
10 p.
article
21 Time dependent modeling of single particle displacement damage in silicon devices Tang, Du
2016
60 C p. 25-32
8 p.
article
22 Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light Rutkauskas, M.
2016
60 C p. 62-66
5 p.
article
                             22 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands