nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A health indicator method for degradation detection of electronic products
|
Kumar, Sachin |
|
2012 |
52 |
2 |
p. 439-445 7 p. |
artikel |
2 |
A technique to mitigate impact of process, voltage and temperature variations on design metrics of SRAM Cell
|
Islam, A. |
|
2012 |
52 |
2 |
p. 405-411 7 p. |
artikel |
3 |
BCB-to-oxide bonding technology for 3D integration
|
Lin, S.L. |
|
2012 |
52 |
2 |
p. 352-355 4 p. |
artikel |
4 |
Current transport and formation of energy structures in narrow Au/n-GaAs Schottky diodes
|
Mamedov, R.K. |
|
2012 |
52 |
2 |
p. 418-424 7 p. |
artikel |
5 |
Dependence of the Au/SnO x /n-LTPS/glass thin film MOS Schottky diode CO gas sensing performances on operating temperature
|
Juang, Feng-Renn |
|
2012 |
52 |
2 |
p. 425-429 5 p. |
artikel |
6 |
Effect of additive N2 and Ar gases on surface smoothening and fracture strength of Si wafers during high-speed chemical dry thinning
|
Heo, W. |
|
2012 |
52 |
2 |
p. 412-417 6 p. |
artikel |
7 |
Electromigration reliability of interconnections in RF low noise amplifier circuit
|
He, Feifei |
|
2012 |
52 |
2 |
p. 446-454 9 p. |
artikel |
8 |
Fabrication of vertical thin-GaN light-emitting diode by low-temperature Cu/Sn/Ag wafer bonding
|
Chen, Y.J. |
|
2012 |
52 |
2 |
p. 381-384 4 p. |
artikel |
9 |
Guest Editorial – Low Temperature Processing for Microelectronics and Microsystems Packaging
|
Suga, Tadatomo |
|
2012 |
52 |
2 |
p. 301- 1 p. |
artikel |
10 |
High-lead flip chip bump cracking on the thin organic substrate in a module package
|
Jang, J.W. |
|
2012 |
52 |
2 |
p. 455-460 6 p. |
artikel |
11 |
High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure
|
Dong, Zhihua |
|
2012 |
52 |
2 |
p. 434-438 5 p. |
artikel |
12 |
Inside front cover - Editorial board
|
|
|
2012 |
52 |
2 |
p. IFC- 1 p. |
artikel |
13 |
Investigation of fluorine containing plasma activation for room-temperature bonding of Si-based materials
|
Wang, Chenxi |
|
2012 |
52 |
2 |
p. 347-351 5 p. |
artikel |
14 |
Low temperature bonding technology for 3D integration
|
Ko, Cheng-Ta |
|
2012 |
52 |
2 |
p. 302-311 10 p. |
artikel |
15 |
Low temperature CuCu thermo-compression bonding with temporary passivation of self-assembled monolayer and its bond strength enhancement
|
Tan, C.S. |
|
2012 |
52 |
2 |
p. 321-324 4 p. |
artikel |
16 |
Low temperature direct bonding: An attractive technique for heterostructures build-up
|
Moriceau, H. |
|
2012 |
52 |
2 |
p. 331-341 11 p. |
artikel |
17 |
Low temperature fabricated conductive lines on flexible substrate by inkjet printing
|
Liu, Yu-Feng |
|
2012 |
52 |
2 |
p. 391-397 7 p. |
artikel |
18 |
Low temperature fabrication of Ni–P metallic patterns on ITO substrates utilizing inkjet printing
|
Liu, Yih-Ming |
|
2012 |
52 |
2 |
p. 398-404 7 p. |
artikel |
19 |
Low-temperature low-pressure die attach with hybrid silver particle paste
|
Suganuma, K. |
|
2012 |
52 |
2 |
p. 375-380 6 p. |
artikel |
20 |
Low temperature nanointegration for emerging biomedical applications
|
Howlader, Matiar M.R. |
|
2012 |
52 |
2 |
p. 361-374 14 p. |
artikel |
21 |
Nanoadhesion layer for enhanced Si–Si and Si–SiN wafer bonding
|
Kondou, Ryuichi |
|
2012 |
52 |
2 |
p. 342-346 5 p. |
artikel |
22 |
Nanoporous gold bumps for low temperature bonding
|
Oppermann, Hermann |
|
2012 |
52 |
2 |
p. 356-360 5 p. |
artikel |
23 |
Overview of low temperature hydrophilic Ge to Si direct bonding for heterogeneous integration
|
Byun, Ki Yeol |
|
2012 |
52 |
2 |
p. 325-330 6 p. |
artikel |
24 |
Solid-state interfacial reactions at the solder joints employing Au/Pd/Ni and Au/Ni as the surface finish metallizations
|
Lin, Chi-Pu |
|
2012 |
52 |
2 |
p. 385-390 6 p. |
artikel |
25 |
To the understanding of the formation of the III–V based droplet epitxial nanorings
|
Nemcsics, Ákos |
|
2012 |
52 |
2 |
p. 430-433 4 p. |
artikel |
26 |
Wafer-level Cu–Cu bonding technology
|
Tang, Ya-Sheng |
|
2012 |
52 |
2 |
p. 312-320 9 p. |
artikel |