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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A 0.11 μm CMOS technology featuring copper and very low k interconnects with high performance and reliability Takao, Yoshihiro
2002
42 1 p. 15-25
11 p.
artikel
2 Application of forward gated-diode R–G current method in extracting F–N stress-induced interface traps in SOI NMOSFETs He, Jin
2002
42 1 p. 145-148
4 p.
artikel
3 A reliability of different metal contacts with amorphous carbon Paul, S
2002
42 1 p. 141-143
3 p.
artikel
4 A simple method for evaluating the transient thermal response of semiconductor devices Shammas, N.Y.A
2002
42 1 p. 109-117
9 p.
artikel
5 Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs Suemitsu, Tetsuya
2002
42 1 p. 47-52
6 p.
artikel
6 Calendar 2002
42 1 p. I-VII
nvt p.
artikel
7 Characterization of solder interfaces using laser flash metrology Chiu, Chia-Pin
2002
42 1 p. 93-100
8 p.
artikel
8 Effect of the drop impact on BGA/CSP package reliability Mishiro, Kinuko
2002
42 1 p. 77-82
6 p.
artikel
9 High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study Sozzi, Giovanna
2002
42 1 p. 53-59
7 p.
artikel
10 Improving thermal performance of miniature heat pipe for notebook PC cooling Moon, Seok Hwan
2002
42 1 p. 135-140
6 p.
artikel
11 Influence of test techniques on soft breakdown detection in ultra-thin oxides Brisbin, Douglas
2002
42 1 p. 35-39
5 p.
artikel
12 Integrated electro-thermomechanical analysis of nonuniformly chip-powered microelectronic system Yuan, Tsorng-Dih
2002
42 1 p. 101-108
8 p.
artikel
13 [No title] 2002
42 1 p. 1-
1 p.
artikel
14 Novel design of driver and ESD transistors with significantly reduced silicon area Verhaege, Koen G
2002
42 1 p. 3-13
11 p.
artikel
15 Precise spice macromodel applied to high-voltage power MOSFET Lomeli, F.S
2002
42 1 p. 149-152
4 p.
artikel
16 Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors Quintero, Rodolfo
2002
42 1 p. 67-76
10 p.
artikel
17 Reduction of self-heating effect on SOIM devices Roig, J
2002
42 1 p. 61-66
6 p.
artikel
18 Reliability and routability consideration for MCM placement Huang, Yu-Jung
2002
42 1 p. 83-91
9 p.
artikel
19 Reliability improvement of fluorescent lamp using grey forecasting model Chiao, C.-H.
2002
42 1 p. 127-134
8 p.
artikel
20 Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs Fadlallah, M
2002
42 1 p. 41-46
6 p.
artikel
21 The correlation between the low-frequency electrical noise of high-power quantum well lasers and devices surface non-radiative current Guijun, Hu
2002
42 1 p. 153-156
4 p.
artikel
22 The effects of curing parameters on the properties development of an epoxy encapsulant material Naito, Christine
2002
42 1 p. 119-125
7 p.
artikel
23 Thermomechanical property of diffusion barrier layer and its effect on the stress characteristics of copper submicron interconnect structures Zhao, Jie-Hua
2002
42 1 p. 27-34
8 p.
artikel
                             23 gevonden resultaten
 
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