| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Aggravated NBTI reliability due to hard-to-detect open defects
|
Aguirre, Gustavo
|
|
|
160 |
C |
p.
|
artikel
|
| 2 |
Analytical solution for forced vibration of multilayer structures composed of plates with different geometric dimensions
|
Li, Bin
|
|
|
160 |
C |
p.
|
artikel
|
| 3 |
Analyzing false turn-on events with varying gate drive parameters in high voltage GaN devices
|
Kashyap, Nishant
|
|
|
160 |
C |
p.
|
artikel
|
| 4 |
A review on warpage measurement metrologies for advanced electronic packaging
|
Sun, Guoli
|
|
|
160 |
C |
p.
|
artikel
|
| 5 |
A trench beside field limiting rings terminal for improved 4H-SiC junction barrier Schottky diodes: Proposal and investigation
|
Ye, Xiaofeng
|
|
|
160 |
C |
p.
|
artikel
|
| 6 |
Characteristics and avalanche investigation of SiC VDMOSFETs with enhanced P-Based implantation
|
Luo, Houcai
|
|
|
160 |
C |
p.
|
artikel
|
| 7 |
Cross-scale finite element analysis of PCBA thermal cycling based on manufacturing history for more accurate fatigue life prediction of solder joints
|
Zheng, Ruiqian
|
|
|
160 |
C |
p.
|
artikel
|
| 8 |
Deep n-well dtscr with fast turn-on speed for low-voltage esd protection applications
|
Ma, Boyang
|
|
|
160 |
C |
p.
|
artikel
|
| 9 |
Editorial Board
|
|
|
|
160 |
C |
p.
|
artikel
|
| 10 |
Evaluation of MOS interface trap generation after BTI stress using flicker noise
|
Jiang, Yi
|
|
|
160 |
C |
p.
|
artikel
|
| 11 |
Exploring the radiant impact of irradiance on the electrical resistance of organic thin film
|
Khan, M.
|
|
|
160 |
C |
p.
|
artikel
|
| 12 |
Fault-tolerant multiplier using self-healing technique
|
Sakali, Raghavendra Kumar
|
|
|
160 |
C |
p.
|
artikel
|
| 13 |
Interface traps in the sub-3 nm technology node: A comprehensive analysis and benchmarking of negative capacitance FinFET and nanosheet FETs - A reliability perspective from device to circuit level
|
Valasa, Sresta
|
|
|
160 |
C |
p.
|
artikel
|
| 14 |
Numerical modeling of total dose effects on CD4007 MOSFET during switched-bias irradiation
|
Sambuco Salomone, L.
|
|
|
160 |
C |
p.
|
artikel
|
| 15 |
Performance of thermo-compression bonding for HgCdTe based focal plane array
|
Singh, Anand
|
|
|
160 |
C |
p.
|
artikel
|
| 16 |
Revisiting row hammer: A deep dive into understanding and resolving the issue
|
Wang, Haibin
|
|
|
160 |
C |
p.
|
artikel
|
| 17 |
Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy study
|
Al-Mamun, Nahid Sultan
|
|
|
160 |
C |
p.
|
artikel
|
| 18 |
The impact of paste alloy, paste volume, and surface finish on solder joint
|
Alakayleh, Abdallah
|
|
|
160 |
C |
p.
|
artikel
|
| 19 |
Two-step sub-modeling framework for thermomechanical fatigue analysis of solder joints in DRAM module
|
Lee, Hyun Suk
|
|
|
160 |
C |
p.
|
artikel
|
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