| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerated mechanical low cycle fatigue in isothermal solder interconnects
|
Marbut, Cody J.
|
|
|
116 |
C |
p.
|
artikel
|
| 2 |
A study on the interfacial adhesion energy between capping layer and dielectric for cu interconnects
|
Kim, Cheol
|
|
|
116 |
C |
p.
|
artikel
|
| 3 |
Characterization method of IGBT comprehensive health index based on online status data
|
Zhang, Jinli
|
|
|
116 |
C |
p.
|
artikel
|
| 4 |
Cryogenic investigation of the negative pinch-off voltage Vpinch-off, leakage current and interface defects in the Al0.22Ga0.78N/GaN/SiC HEMT
|
Jabbari, I.
|
|
|
116 |
C |
p.
|
artikel
|
| 5 |
Degradation modeling with spatial mapping method in low temperature poly silicon thin film transistor aged off-state bias
|
Kim, Kihwan
|
|
|
116 |
C |
p.
|
artikel
|
| 6 |
Dielectric investigation of In4Se96-xSx semiconductor: Relaxation and conduction mechanism
|
Ganaie, Mohsin
|
|
|
116 |
C |
p.
|
artikel
|
| 7 |
Editorial Board
|
|
|
|
116 |
C |
p.
|
artikel
|
| 8 |
Effects of thermal neutron radiation on a hardware-implemented machine learning algorithm
|
Garay Trindade, M.
|
|
|
116 |
C |
p.
|
artikel
|
| 9 |
Impact of inter-metallic compound thickness on thermo-mechanical reliability of solder joints in solar cell assembly
|
Zarmai, Musa T.
|
|
|
116 |
C |
p.
|
artikel
|
| 10 |
Improvement of negative bias temperature instability of LTPS TFTs by high pressure H2O annealing
|
Kim, Soonkon
|
|
|
116 |
C |
p.
|
artikel
|
| 11 |
Investigation on γ radiation effects of N-channel VDMOSFETs irradiated without electric field stress
|
Zeng, Guang
|
|
|
116 |
C |
p.
|
artikel
|
| 12 |
Ionizing radiation damage in 65 nm CMOS technology: Influence of geometry, bias and temperature at ultra-high doses
|
Borghello, G.
|
|
|
116 |
C |
p.
|
artikel
|
| 13 |
Ionizing radiation hardness tests of GaN HEMTs for harsh environments
|
Vilas Bôas, Alexis C.
|
|
|
116 |
C |
p.
|
artikel
|
| 14 |
Latency optimized clustered error mitigation for multi-level flash memory using product code
|
Mandal, Swagata
|
|
|
116 |
C |
p.
|
artikel
|
| 15 |
Mechanical behavior investigation of press-fit connector based on finite element simulation and its reliability evaluation
|
Wang, Ruoyu
|
|
|
116 |
C |
p.
|
artikel
|
| 16 |
Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
|
Shu, Lei
|
|
|
116 |
C |
p.
|
artikel
|
| 17 |
Securing RSA hardware accelerators through residue checking
|
Lasheras, Ana
|
|
|
116 |
C |
p.
|
artikel
|
| 18 |
Stitch-bond reliability evaluation by construction analysis
|
Akbari, Hossein
|
|
|
116 |
C |
p.
|
artikel
|
| 19 |
Structural and optical effects of low dose rate Co-60 gamma irradiation on PbS thin films
|
Ismail, A.
|
|
|
116 |
C |
p.
|
artikel
|
| 20 |
The impact of total ionizing dose on RF performance of 130 nm PD SOI I/O nMOSFETs
|
Xie, Tiantian
|
|
|
116 |
C |
p.
|
artikel
|
| 21 |
Toward standardization of low impedance contact CDM
|
Jack, Nathan
|
|
|
116 |
C |
p.
|
artikel
|
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