nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate small signal modeling and extraction of silicon MOSFET for RF IC application
|
Tang, Yang |
|
2010 |
54 |
11 |
p. 1312-1318 7 p. |
artikel |
2 |
A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
|
Cho, Moonju |
|
2010 |
54 |
11 |
p. 1384-1391 8 p. |
artikel |
3 |
AlGaN/GaN MOSHFETs with HfO2 gate oxide: A simulation study
|
Hayashi, Y. |
|
2010 |
54 |
11 |
p. 1367-1371 5 p. |
artikel |
4 |
Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation
|
Kamada, Yudai |
|
2010 |
54 |
11 |
p. 1392-1397 6 p. |
artikel |
5 |
Analysis of transient behavior of AlGaN/GaN MOSHFET
|
Hayashi, Y. |
|
2010 |
54 |
11 |
p. 1451-1456 6 p. |
artikel |
6 |
Analytical current equation for short channel SOI multigate FETs including 3D effects
|
Kloes, Alexander |
|
2010 |
54 |
11 |
p. 1408-1415 8 p. |
artikel |
7 |
An analytical model for square GAA MOSFETs including quantum effects
|
Moreno, E. |
|
2010 |
54 |
11 |
p. 1463-1469 7 p. |
artikel |
8 |
A new analytical high frequency noise parameter model for AlGaN/GaN HEMT
|
Cheng, Xiaoxu |
|
2010 |
54 |
11 |
p. 1300-1303 4 p. |
artikel |
9 |
A new vertical MOSFET “Vertical Logic Circuit (VLC) MOSFET” suppressing asymmetric characteristics and realizing an ultra compact and robust logic circuit
|
Sakui, Koji |
|
2010 |
54 |
11 |
p. 1457-1462 6 p. |
artikel |
10 |
A versatile compact model for ballistic 1D transistor: GNRFET and CNTFET comparison
|
Frégonèse, Sébastien |
|
2010 |
54 |
11 |
p. 1332-1338 7 p. |
artikel |
11 |
Bipolar magnetotransistor sensor with digital output
|
Tikhonov, R.D. |
|
2010 |
54 |
11 |
p. 1488-1491 4 p. |
artikel |
12 |
Characteristics of current distribution by designed electrode patterns for high power ThinGaN LED
|
Tu, S.H. |
|
2010 |
54 |
11 |
p. 1438-1443 6 p. |
artikel |
13 |
Comparison and improvement of two core compact models for double-gate MOSFETs
|
Zhou, Xingye |
|
2010 |
54 |
11 |
p. 1444-1446 3 p. |
artikel |
14 |
Comparison of positive and negative bias-temperature instability on MOSFETs with HfO2/LaO x and HfO2/AlO x dielectric stacks
|
Lu, Chun-Chang |
|
2010 |
54 |
11 |
p. 1474-1478 5 p. |
artikel |
15 |
Crystallographic orientation effects on the performance of InP-based heterojunction bipolar transistors
|
Driad, R. |
|
2010 |
54 |
11 |
p. 1343-1348 6 p. |
artikel |
16 |
2D analytical calculation of the electrostatic potential in lightly doped Schottky barrier Double-Gate MOSFET
|
Schwarz, Mike |
|
2010 |
54 |
11 |
p. 1372-1380 9 p. |
artikel |
17 |
Development of Time-resolved UV Micro-Raman Spectroscopy to measure temperature in AlGaN/GaN HEMTs
|
Lancry, O. |
|
2010 |
54 |
11 |
p. 1434-1437 4 p. |
artikel |
18 |
Editorial Board
|
|
|
2010 |
54 |
11 |
p. IFC- 1 p. |
artikel |
19 |
Exploiting magnetic sensing capabilities of Short Split-Drain MAGFETs
|
Santillan-Quiñonez, Gerard F. |
|
2010 |
54 |
11 |
p. 1239-1245 7 p. |
artikel |
20 |
Fabrication of self-aligned TFTs with a ultra-low temperature polycrystalline silicon process on metal foils
|
Moon, Jaehyun |
|
2010 |
54 |
11 |
p. 1326-1331 6 p. |
artikel |
21 |
High breakdown AlGaN/GaN MOSHEMT with thermal oxidized Ni/Ti as gate insulator
|
Dong, Zhihua |
|
2010 |
54 |
11 |
p. 1339-1342 4 p. |
artikel |
22 |
Impact of circuit assist methods on margin and performance in 6T SRAM
|
Mann, Randy W. |
|
2010 |
54 |
11 |
p. 1398-1407 10 p. |
artikel |
23 |
Impact of transparent conductive oxide on the admittance of thin film solar cells
|
Principato, F. |
|
2010 |
54 |
11 |
p. 1284-1290 7 p. |
artikel |
24 |
Improving the cell characteristics using arch-active profile in NAND flash memory having 60nm design-rule
|
Kang, Daewoong |
|
2010 |
54 |
11 |
p. 1263-1268 6 p. |
artikel |
25 |
Influence of sputtering pressure on morphological, mechanical and electrical properties of Al-doped ZnO films
|
Kar, J.P. |
|
2010 |
54 |
11 |
p. 1447-1450 4 p. |
artikel |
26 |
Infrared light emitting device with two color emission
|
Das, Naresh C. |
|
2010 |
54 |
11 |
p. 1381-1383 3 p. |
artikel |
27 |
Mechanical bending effect on the photo leakage currents characteristic of amorphous silicon thin film transistors
|
Wang, M.C. |
|
2010 |
54 |
11 |
p. 1485-1487 3 p. |
artikel |
28 |
Modeling local electrical fluctuations in 45nm heavily pocket-implanted bulk MOSFET
|
Mezzomo, Cecilia M. |
|
2010 |
54 |
11 |
p. 1359-1366 8 p. |
artikel |
29 |
Multiple gate NVM cells with improved Fowler–Nordheim tunneling program and erase performances
|
Gerardi, C. |
|
2010 |
54 |
11 |
p. 1319-1325 7 p. |
artikel |
30 |
On the possibility of improving silicon solar cell efficiency through impurity photovoltaic effect and compensation
|
Pavel, Akeed A. |
|
2010 |
54 |
11 |
p. 1278-1283 6 p. |
artikel |
31 |
Proximity effects of beryllium-doped GaN buffer layers on the electronic properties of epitaxial AlGaN/GaN heterostructures
|
Storm, D.F. |
|
2010 |
54 |
11 |
p. 1470-1473 4 p. |
artikel |
32 |
Reconfigurable Special Test Circuit of physics-based IGBT models parameter extraction
|
Rodríguez, Marco A. |
|
2010 |
54 |
11 |
p. 1246-1256 11 p. |
artikel |
33 |
Retention modeling of nanocrystalline flash memories: A Monte Carlo approach
|
Ghosh, Bahniman |
|
2010 |
54 |
11 |
p. 1295-1299 5 p. |
artikel |
34 |
Scaling projections for Sb-based p-channel FETs
|
Ancona, M.G. |
|
2010 |
54 |
11 |
p. 1349-1358 10 p. |
artikel |
35 |
Selection of gate length and gate bias to make nanoscale metal–oxide-semiconductor transistors less sensitive to both statistical gate length variation and temperature variation
|
Yang, Peizhen |
|
2010 |
54 |
11 |
p. 1304-1311 8 p. |
artikel |
36 |
Self-consistent 1-D Schrödinger–Poisson solver for III–V heterostructures accounting for conduction band non-parabolicity
|
Wang, Lingquan |
|
2010 |
54 |
11 |
p. 1257-1262 6 p. |
artikel |
37 |
Sensitivity analysis of magnetic field sensors utilizing spin-dependent recombination in silicon diodes
|
Jander, Albrecht |
|
2010 |
54 |
11 |
p. 1479-1484 6 p. |
artikel |
38 |
Solvent dependent behaviour of poly(9-vinylcarbazole)-based polymer light emitting diodes
|
Alonso, J.L. |
|
2010 |
54 |
11 |
p. 1269-1272 4 p. |
artikel |
39 |
Study of current collapse by quiescent-bias-stresses in rf-plasma assisted MBE grown AlGaN/GaN high-electron-mobility transistors
|
Arulkumaran, S. |
|
2010 |
54 |
11 |
p. 1430-1433 4 p. |
artikel |
40 |
The effect of photodiode shape on charge transfer in CMOS image sensors
|
Shin, Bhumjae |
|
2010 |
54 |
11 |
p. 1416-1420 5 p. |
artikel |
41 |
Turn-on voltage engineering and enhancement mode operation of AlGaN/GaN high electron mobility transistor using multiple heterointerfaces
|
Tripathi, N. |
|
2010 |
54 |
11 |
p. 1291-1294 4 p. |
artikel |
42 |
Unified large and small signal non-quasi-static model for long channel symmetric DG MOSFET
|
Sarkar, Sudipta |
|
2010 |
54 |
11 |
p. 1421-1429 9 p. |
artikel |
43 |
Variable temperature characterization of low-dimensional effects in tri-gate SOI MOSFETs
|
Barrett, C. |
|
2010 |
54 |
11 |
p. 1273-1277 5 p. |
artikel |