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Details for article 2 of 43 found articles
| Title: |
A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique |
| Author: |
Cho, Moonju Degraeve, Robin Roussel, Philippe Govoreanu, Bogdan Kaczer, Ben Zahid, Mohammed B. Simoen, Eddy Arreghini, Antonio Jurczak, Malgorzata Houdt, Jan Van Groeseneken, Guido |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 54 (2010) nr. 11 pages 8 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 43 found articles
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