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Journal description
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Details for article 4 of 43 found articles
| Title: |
Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation |
| Author: |
Kamada, Yudai Fujita, Shizuo Hiramatsu, Takahiro Matsuda, Tokiyoshi Furuta, Mamoru Hirao, Takashi |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 54 (2010) nr. 11 pages 6 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 43 found articles
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