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                             35 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A current model for FOI FinFETs with back-gate bias modulation Liu, F.Y.

185 C p.
artikel
2 Analog characteristics of n-type vertically stacked nanowires Mariniello, Genaro

185 C p.
artikel
3 A physics-based compact model of phase change for the design of cross-point storage-class memories Kim, Donguk

185 C p.
artikel
4 A simple, robust, and accurate compact model for a wide variety of complementary resistive switching devices Saludes-Tapia, M.

185 C p.
artikel
5 A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development Alepidis, M.

185 C p.
artikel
6 Assessment of 2D-FET Based Digital and Analog Circuits on Paper Vatalaro, Massimo

185 C p.
artikel
7 Characterization of the defect density states in MoOx for c-Si solar cell applications Scirè, D.

185 C p.
artikel
8 Charge-based modeling of ultra narrow junctionless cylindrical nanowire FETs Shafizade, Danial

185 C p.
artikel
9 Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications Gupta, Sumreti

185 C p.
artikel
10 Crystalline insulators for scalable 2D nanoelectronics Illarionov, Y.Y.

185 C p.
artikel
11 Current annealing to improve drain output performance of β-Ga2O3 field-effect transistor Bae, Hagyoul

185 C p.
artikel
12 Deep insights on new embedded resistance and gated diode on thin film silicon BIMOS device with and without external polysilicon resistance for advanced ESD protection in FD-SOI technology Galy, Ph.

185 C p.
artikel
13 Gate dielectric material influence on DC behavior of MO(I)SHEMT devices operating up to 150 °C Agopian, P.G.D.

185 C p.
artikel
14 Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides Celano, U.

185 C p.
artikel
15 High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applications Khosla, Robin

185 C p.
artikel
16 III-V-on-Si transistor technologies: Performance boosters and integration Caimi, D.

185 C p.
artikel
17 Improved interface characteristics of Mo/4H-SiC schottky contact Chen, Ke-han

185 C p.
artikel
18 Influence of fin width variation on the electrical characteristics of n-type junctionless nanowire transistors at high temperatures Ribeiro, Thales Augusto

185 C p.
artikel
19 Influence of variability on the performance of HfO2 memristor-based convolutional neural networks Romero-Zaliz, R.

185 C p.
artikel
20 On the interpretation of MOS impedance data in both series and parallel circuit topologies Caruso, E.

185 C p.
artikel
21 Opportunity for band alignment manipulation of perovskite oxide stacks by interfacial dipole layer formation Tamura, Atsushi

185 C p.
artikel
22 Optimization of a nanoribbon charge-based biosensor using gateless BESOI pMOSFET structure Sasaki, K.R.A.

185 C p.
artikel
23 Revisited parasitic bipolar effect in FDSOI MOSFETs: Mechanism, gain extraction and circuit applications Wang, G.Q.

185 C p.
artikel
24 Single and triple insulator Metal-Insulator-Metal diodes for infrared rectennas Tekin, S.B.

185 C p.
artikel
25 Single-poly floating-gate memory cell options for analog neural networks Paliy, Maksym

185 C p.
artikel
26 SPICE modeling of cycle-to-cycle variability in RRAM devices Salvador, E.

185 C p.
artikel
27 Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions Diaz-Fortuny, Javier

185 C p.
artikel
28 Stochastic based compact model to predict highly variable electrical characteristics of organic CBRAM devices Guitarra, S.

185 C p.
artikel
29 Structural properties of Ge-Sb-Te alloys Cinkaya, Hatun

185 C p.
artikel
30 TCAD modeling of bias temperature instabilities in SiC MOSFETs Carangelo, G.

185 C p.
artikel
31 Technology of sub-100 nm InAlN/GaN HEMTs on silicon with suppressed leakage current Cui, Peng

185 C p.
artikel
32 Thermal cross-coupling effects in side-by-side UTBB-FDSOI transistors Costa, Fernando J.

185 C p.
artikel
33 Two-pulse switching scheme and reinforcement learning for energy efficient SOT-MRAM simulations de Orio, R.L.

185 C p.
artikel
34 Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation Magnone, P.

185 C p.
artikel
35 Unified RTN and BTI statistical compact modeling from a defect-centric perspective Pedreira, G.

185 C p.
artikel
                             35 gevonden resultaten
 
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