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                                       Details for article 15 of 35 found articles
 
 
  High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applications
 
 
Title: High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applications
Author: Khosla, Robin
Schwarz, Daniel
Funk, Hannes S.
Guguieva, Kateryna
Schulze, Jörg
Appeared in: Solid-state electronics
Paging: Volume 185 () nr. C pages p.
Year: 2021
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 35 found articles
 
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