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Journal description
All volumes of the corresponding journal
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Details for article 35 of 35 found articles
| Title: |
Unified RTN and BTI statistical compact modeling from a defect-centric perspective |
| Author: |
Pedreira, G. Martin-Martinez, J. Saraza-Canflanca, P. Castro-Lopez, R. Rodriguez, R. Roca, E. Fernandez, F.V. Nafria, M. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 185 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 35 found articles
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