Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             28 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A low knee voltage and high breakdown voltage of 4H-SiC TSBS employing poly-Si/Ni Schottky scheme Kim, Dong Young
2018
140 C p. 8-11
artikel
2 Analysis of electrical characteristics and proposal of design guide for ultra-scaled nanoplate vertical FET and 6T-SRAM Seo, Youngsoo
2018
140 C p. 69-73
artikel
3 Comparison of dual-k spacer and single-k spacer for single NWFET and 3-stack NWFET Ko, Hyungwoo
2018
140 C p. 64-68
artikel
4 Comparison of work function variation between FinFET and 3D stacked nanowire FET devices for 6-T SRAM reliability Ko, Kyul
2018
140 C p. 74-79
artikel
5 Designing 4H-SiC P-shielding trench gate MOSFET to optimize on-off electrical characteristics Kyoung, Sinsu
2018
140 C p. 23-28
artikel
6 Editorial Board 2018
140 C p. ii
artikel
7 Effect of liquid gate bias rising time in pH sensors based on Si nanowire ion sensitive field effect transistors Jang, Jungkyu
2018
140 C p. 109-114
artikel
8 Effect of oxygen content of the LaAlO3 layer on the synaptic behavior of Pt/LaAlO3/Nb-doped SrTiO3 memristors for neuromorphic applications Jang, Jun Tae
2018
140 C p. 139-143
artikel
9 Effects of structure and oxygen flow rate on the photo-response of amorphous IGZO-based photodetector devices Jang, Jun Tae
2018
140 C p. 115-121
artikel
10 GIDL analysis of the process variation effect in gate-all-around nanowire FET Kim, Shinkeun
2018
140 C p. 59-63
artikel
11 Highly uniform and reliable resistive switching characteristics of a Ni/WOx/p+-Si memory device Kim, Tae-Hyeon
2018
140 C p. 51-54
artikel
12 High performance SONOS flash memory with in-situ silicon nanocrystals embedded in silicon nitride charge trapping layer Lim, Jae-Gab
2018
140 C p. 134-138
artikel
13 Integrated neuron circuit for implementing neuromorphic system with synaptic device Lee, Jeong-Jun
2018
140 C p. 34-40
artikel
14 Investigation of silicide-induced-dopant-activation for steep tunnel junction in tunnel field effect transistor (TFET) Kim, Sihyun
2018
140 C p. 41-45
artikel
15 Lab-on-a-chip based total-phosphorus analysis device utilizing a photocatalytic reaction Jung, Dong Geon
2018
140 C p. 100-108
artikel
16 Multi-layer WSe2 field effect transistor with improved carrier-injection contact by using oxygen plasma treatment Kang, Won-Mook
2018
140 C p. 2-7
artikel
17 New modeling method for the dielectric relaxation of a DRAM cell capacitor Choi, Sujin
2018
140 C p. 29-33
artikel
18 Preface Lee, Jung-Hee
2018
140 C p. 1
artikel
19 Program scheme using common source lines in channel stacked NAND flash memory with layer selection by multilevel operation Kim, Do-Bin
2018
140 C p. 46-50
artikel
20 Read margin analysis of crossbar arrays using the cell-variability-aware simulation method Sun, Wookyung
2018
140 C p. 55-58
artikel
21 Resistive switching characteristics of solution-processed Al–Zn–Sn–O films annealed by microwave irradiation Kim, Tae-Wan
2018
140 C p. 122-128
artikel
22 Resistive switching characteristics of solution-processed organic-inorganic blended films for flexible memory applications Baek, Il-Jin
2018
140 C p. 129-133
artikel
23 Sensing properties of separative paper-based extended-gate ion-sensitive field-effect transistor for cost effective pH sensor applications Cho, Won-Ju
2018
140 C p. 96-99
artikel
24 Systematic analysis of oxide trap distribution of 4H-SiC DMOSFETs using TSCIS and its correlation with BTI and SILC behavior Baek, Sangwon
2018
140 C p. 18-22
artikel
25 The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress Rhee, Jihyun
2018
140 C p. 90-95
artikel
26 TiOx-based thin-film transistors prepared by femtosecond laser pre-annealing Shan, Fei
2018
140 C p. 86-89
artikel
27 Ultra-low rate dry etching conditions for fabricating normally-off field effect transistors on AlGaN/GaN heterostructures Kim, Zin-Sig
2018
140 C p. 12-17
artikel
28 Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors Jung, Haesun
2018
140 C p. 80-85
artikel
                             28 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland