| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate determination of surface orientation of single-crystal wafers using high-resolution X-ray rocking curve measurements
|
Kim, Chang Soo
|
|
2013
|
46 |
5 |
p. 1298-1305
|
artikel
|
| 2 |
2014 American Crystallographic Association Patterson Award to John Helliwell
|
Pastore, Chiara
|
|
2013
|
46 |
5 |
p. 1529-1530
|
artikel
|
| 3 |
A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument
|
Freelon, Byron
|
|
2013
|
46 |
5 |
p. 1508-1512
|
artikel
|
| 4 |
A novel small-angle neutron scattering detector geometry. Corrigendum
|
Kanaki, Kalliopi
|
|
2013
|
46 |
5 |
p. 1528
|
artikel
|
| 5 |
A wide-angle X-ray fibre diffraction method for quantifying collagen orientation across large tissue areas: application to the human eyeball coat
|
Pijanka, Jacek Klaudiusz
|
|
2013
|
46 |
5 |
p. 1481-1489
|
artikel
|
| 6 |
Blind source separation and automatic tissue typing of microdiffraction data by hierarchical nonnegative matrix factorization
|
Ladisa, Massimo
|
|
2013
|
46 |
5 |
p. 1467-1474
|
artikel
|
| 7 |
Calcium carbonate microparticle templates using a PHOS-b-PMAA double hydrophilic copolymer
|
Mihai, Marcela
|
|
2013
|
46 |
5 |
p. 1455-1466
|
artikel
|
| 8 |
Cascade catalysis of highly active bimetallic Au/Pd nanoclusters: structure–function relationship investigation using anomalous small-angle X-ray scattering and UV–Vis spectroscopy
|
Haas, Sylvio
|
|
2013
|
46 |
5 |
p. 1353-1360
|
artikel
|
| 9 |
Charge flipping for routine structure solution
|
van der Lee, A.
|
|
2013
|
46 |
5 |
p. 1306-1315
|
artikel
|
| 10 |
Complete elliptical ring geometry provides energy and instrument calibration for synchrotron-based two-dimensional X-ray diffraction
|
Hart, Michael L.
|
|
2013
|
46 |
5 |
p. 1249-1260
|
artikel
|
| 11 |
Determination of fluctuations in local symmetry and measurement by convergent beam electron diffraction: applications to a relaxor-based ferroelectric crystal after thermal annealing
|
Kim, Kyou-Hyun
|
|
2013
|
46 |
5 |
p. 1331-1337
|
artikel
|
| 12 |
Electron backscatter diffraction study of twins and intergrowths among quartz crystals in granite
|
Zhao, Shan-Rong
|
|
2013
|
46 |
5 |
p. 1414-1424
|
artikel
|
| 13 |
Fourier crystal diffractometry based on refractive optics
|
Ershov, Petr
|
|
2013
|
46 |
5 |
p. 1475-1480
|
artikel
|
| 14 |
Graphene as a protein crystal mounting material to reduce background scatter
|
Wierman, Jennifer L.
|
|
2013
|
46 |
5 |
p. 1501-1507
|
artikel
|
| 15 |
Innovative insights in a plug flow microreactor for operando X-ray studies
|
Figueroa, Santiago J. A.
|
|
2013
|
46 |
5 |
p. 1523-1527
|
artikel
|
| 16 |
Insight into neutron focusing: the out-of-focus condition
|
Hammouda, B.
|
|
2013
|
46 |
5 |
p. 1361-1371
|
artikel
|
| 17 |
INSTAT: a program for computing non-ideal probability density functions of |E|
|
Shmueli, Uri
|
|
2013
|
46 |
5 |
p. 1521-1522
|
artikel
|
| 18 |
Interactive visualization tools for the structural biologist
|
Porebski, Benjamin T.
|
|
2013
|
46 |
5 |
p. 1518-1520
|
artikel
|
| 19 |
Interfacial morphology of low-voltage anodic aluminium oxide
|
Hu, Naiping
|
|
2013
|
46 |
5 |
p. 1386-1396
|
artikel
|
| 20 |
Learning about SANS instruments and data reduction from round robin measurements on samples of polystyrene latex
|
Rennie, Adrian R.
|
|
2013
|
46 |
5 |
p. 1289-1297
|
artikel
|
| 21 |
Microstructure determination of IQ-WB clays: a direct procedure by small-angle X-ray scattering
|
Segad, M.
|
|
2013
|
46 |
5 |
p. 1316-1322
|
artikel
|
| 22 |
Multiple twinning in pure hexagonal close-packed titanium
|
Bao, Lei
|
|
2013
|
46 |
5 |
p. 1397-1406
|
artikel
|
| 23 |
NCImilano: an electron-density-based code for the study of noncovalent interactions
|
Saleh, Gabriele
|
|
2013
|
46 |
5 |
p. 1513-1517
|
artikel
|
| 24 |
Polychromatic energy-dispersive neutron diffraction at a continuous source
|
Simmons, Jason M.
|
|
2013
|
46 |
5 |
p. 1347-1352
|
artikel
|
| 25 |
Residual stress analysis of diamond-coated WC–Co cutting tools: separation of film and substrate information by grazing X-ray diffraction
|
Meixner, M.
|
|
2013
|
46 |
5 |
p. 1323-1330
|
artikel
|
| 26 |
Reversed de Wolff figure of merit and its application to powder indexing solutions
|
Oishi-Tomiyasu, R.
|
|
2013
|
46 |
5 |
p. 1277-1282
|
artikel
|
| 27 |
Rietveld refinement, morphology and optical properties of (Ba1−xSrx)MoO4 crystals
|
Nogueira, I. C.
|
|
2013
|
46 |
5 |
p. 1434-1446
|
artikel
|
| 28 |
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
|
Jongsukswat, Sukswat
|
|
2013
|
46 |
5 |
p. 1261-1265
|
artikel
|
| 29 |
Study of the internal structure of polymer micelles by anomalous small-angle X-ray scattering at two edges
|
Sakou, Megumi
|
|
2013
|
46 |
5 |
p. 1407-1413
|
artikel
|
| 30 |
Thermal expansion of manganese dioxide using high-temperature in situ X-ray diffraction
|
Dose, Wesley M.
|
|
2013
|
46 |
5 |
p. 1283-1288
|
artikel
|
| 31 |
Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar () GaN layers grown from the sidewall of an r-patterned sapphire substrate
|
Lazarev, Sergey
|
|
2013
|
46 |
5 |
p. 1425-1433
|
artikel
|
| 32 |
Towards a detailed resolution smearing kernel for time-of-flight neutron reflectometers
|
Nelson, Andrew Robert John
|
|
2013
|
46 |
5 |
p. 1338-1346
|
artikel
|
| 33 |
Tuning the growth properties of Ge quantum dot lattices in amorphous oxides by matrix type
|
Buljan, M.
|
|
2013
|
46 |
5 |
p. 1490-1500
|
artikel
|
| 34 |
Two-dimensional indirect Fourier transformation for evaluation of small-angle scattering data of oriented samples
|
Fritz-Popovski, Gerhard
|
|
2013
|
46 |
5 |
p. 1447-1454
|
artikel
|
| 35 |
Ultrafast reciprocal-space mapping with a convergent beam
|
Schick, Daniel
|
|
2013
|
46 |
5 |
p. 1372-1377
|
artikel
|
| 36 |
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
|
Stefenelli, Mario
|
|
2013
|
46 |
5 |
p. 1378-1385
|
artikel
|
| 37 |
X-ray residual stress analysis on multilayer systems: an approach for depth-resolved data evaluation
|
Klaus, Manuela
|
|
2013
|
46 |
5 |
p. 1266-1276
|
artikel
|
Tijdschrift beschrijving