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Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction |
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Titel: |
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction |
Auteur: |
Jongsukswat, Sukswat Fukamachi, Tomoe Ju, Dongying Negishi, Riichirou Hirano, Keiichi Kawamura, Takaaki |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 46 (2013) nr. 5 pagina's 1261-1265 |
Jaar: |
2013-00-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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