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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison |
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Titel: |
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison |
Auteur: |
Stefenelli, Mario Todt, Juraj Riedl, Angelika Ecker, Werner Müller, Thomas Daniel, Rostislav Burghammer, Manfred Keckes, Jozef |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 46 (2013) nr. 5 pagina's 1378-1385 |
Jaar: |
2013-00-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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