|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 36 of 37 found articles
| Title: |
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison |
| Author: |
Stefenelli, Mario Todt, Juraj Riedl, Angelika Ecker, Werner Müller, Thomas Daniel, Rostislav Burghammer, Manfred Keckes, Jozef |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 5 pages 1378-1385 |
| Year: |
2013-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 37 found articles
| << previous | next >> |