| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Gaussian–Hermite polynomials function for X-ray diffraction profile fitting
|
Sánchez-Bajo, F.
|
|
1999
|
32 |
4 |
p. 730-735
|
artikel
|
| 2 |
A high-temperature furnace for X-ray diffraction with directly machined α-Al2O3 ceramic parts
|
Estermann, Michael
|
|
1999
|
32 |
4 |
p. 833-836
|
artikel
|
| 3 |
A maximum entropy method for determining column-length distributions from size-broadened X-ray diffraction profiles
|
Armstrong, N.
|
|
1999
|
32 |
4 |
p. 600-613
|
artikel
|
| 4 |
Angle calculations for a `4S+2D' six-circle diffractometer
|
You, H.
|
|
1999
|
32 |
4 |
p. 614-623
|
artikel
|
| 5 |
An improved goniometer head for high-temperature single-crystal X-ray diffraction
|
Delarue, Patrice
|
|
1999
|
32 |
4 |
p. 824-826
|
artikel
|
| 6 |
A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. II. Examples
|
Genzel, Ch.
|
|
1999
|
32 |
4 |
p. 779-787
|
artikel
|
| 7 |
A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept
|
Genzel, Christoph
|
|
1999
|
32 |
4 |
p. 770-778
|
artikel
|
| 8 |
Automatic orientation determination from Kikuchi patterns
|
Morawiec, A.
|
|
1999
|
32 |
4 |
p. 788-798
|
artikel
|
| 9 |
DATPROC9: a data-processing program based on a new extension of the learnt-profile method
|
Gałdecka, E.
|
|
1999
|
32 |
4 |
p. 827-832
|
artikel
|
| 10 |
Deconvolution of the two-dimensional point-spread function of area detectors using the maximum-entropy algorithm
|
Graafsma, H.
|
|
1999
|
32 |
4 |
p. 683-691
|
artikel
|
| 11 |
Difference structure-factor normalization for heavy-atom or anomalous-scattering substructure determinations
|
Blessing, Robert H.
|
|
1999
|
32 |
4 |
p. 664-670
|
artikel
|
| 12 |
Direct analysis of small-angle smeared intensity tails. I. General results
|
Ciccariello, Salvino
|
|
1999
|
32 |
4 |
p. 579-589
|
artikel
|
| 13 |
Direct analysis of small-angle smeared intensity tails. II. Applications
|
Ciccariello, Salvino
|
|
1999
|
32 |
4 |
p. 590-599
|
artikel
|
| 14 |
DISCUS, a program for diffuse scattering and defect structure simulations – update
|
Proffen, Th.
|
|
1999
|
32 |
4 |
p. 838-839
|
artikel
|
| 15 |
Flat-specimen effect as a convolution in powder diffractometry with Bragg–Brentano geometry
|
Ida, T.
|
|
1999
|
32 |
4 |
p. 634-640
|
artikel
|
| 16 |
Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects
|
Scardi, Paolo
|
|
1999
|
32 |
4 |
p. 671-682
|
artikel
|
| 17 |
High-resolution transmission electron microscopy study of the ϕ′- and δ-AlON spinel phases of the pseudo-binary section AlN–Al2O3
|
Tabary, P.
|
|
1999
|
32 |
4 |
p. 755-760
|
artikel
|
| 18 |
Laboratory X-ray powder diffraction: a comparison of different geometries with special attention to the usage of the Cu Kα doublet
|
Heger, Gernot
|
|
1999
|
32 |
4 |
p. 799-807
|
artikel
|
| 19 |
Measurement of single-crystal elastic constants by neutron diffraction from polycrystals
|
Howard, C. J.
|
|
1999
|
32 |
4 |
p. 624-633
|
artikel
|
| 20 |
On the number of independent reflections in a powder diffraction pattern
|
David, W. I. F.
|
|
1999
|
32 |
4 |
p. 654-663
|
artikel
|
| 21 |
On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates
|
Machajdík, D.
|
|
1999
|
32 |
4 |
p. 736-743
|
artikel
|
| 22 |
Optimization of resolution–intensity balance in angular-dispersive powder diffractometry at a synchrotron radiation source
|
Grabcev, B.
|
|
1999
|
32 |
4 |
p. 641-653
|
artikel
|
| 23 |
Pepinsky's Machine: an interactive graphics-based Fourier synthesis program with applications in teaching and research
|
Glykos, Nicholas M.
|
|
1999
|
32 |
4 |
p. 821-823
|
artikel
|
| 24 |
PowderX: Windows-95-based program for powder X-ray diffraction data processing
|
Dong, Cheng
|
|
1999
|
32 |
4 |
p. 838
|
artikel
|
| 25 |
Quantitative phase analysis of α- and β-silicon nitrides. I. Estimation of errors
|
Toraya, H.
|
|
1999
|
32 |
4 |
p. 704-715
|
artikel
|
| 26 |
Quantitative phase analysis of α- and β-silicon nitrides. II. Round robins
|
Toraya, H.
|
|
1999
|
32 |
4 |
p. 716-729
|
artikel
|
| 27 |
Second-order neutron optics of three-axis spectrometers. I. Quasielastic scattering
|
Stoica, A. D.
|
|
1999
|
32 |
4 |
p. 744-754
|
artikel
|
| 28 |
Simulations of femtosecond X-ray diffraction from unperturbed and rapidly heated single crystals
|
Wark, J. S.
|
|
1999
|
32 |
4 |
p. 692-703
|
artikel
|
| 29 |
Structure of sodium para-hydroxybenzoate, NaO2C–C6H4OH by powder diffraction: application of a phenomenological model of anisotropic peak width
|
Dinnebier, R. E.
|
|
1999
|
32 |
4 |
p. 761-769
|
artikel
|
| 30 |
Use of an open-flow helium cryostat for macromolecular cryocrystallography
|
Hanson, B. Leif
|
|
1999
|
32 |
4 |
p. 814-820
|
artikel
|
| 31 |
WinGX suite for small-molecule single-crystal crystallography
|
Farrugia, Louis J.
|
|
1999
|
32 |
4 |
p. 837-838
|
artikel
|
| 32 |
XFPA98: a program for automatic structure determination and automatic refinement
|
Pavelcik, F.
|
|
1999
|
32 |
4 |
p. 839-840
|
artikel
|
| 33 |
X-ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments
|
Gualtieri, Alessandro F.
|
|
1999
|
32 |
4 |
p. 808-813
|
artikel
|
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