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33 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A Gaussian–Hermite polynomials function for X-ray diffraction profile fitting	Sánchez-Bajo, F.		1999	32	4	p. 730-735	article
2	A high-temperature furnace for X-ray diffraction with directly machined α-Al2O3 ceramic parts	Estermann, Michael		1999	32	4	p. 833-836	article
3	A maximum entropy method for determining column-length distributions from size-broadened X-ray diffraction profiles	Armstrong, N.		1999	32	4	p. 600-613	article
4	Angle calculations for a `4S+2D' six-circle diffractometer	You, H.		1999	32	4	p. 614-623	article
5	An improved goniometer head for high-temperature single-crystal X-ray diffraction	Delarue, Patrice		1999	32	4	p. 824-826	article
6	A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. II. Examples	Genzel, Ch.		1999	32	4	p. 779-787	article
7	A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept	Genzel, Christoph		1999	32	4	p. 770-778	article
8	Automatic orientation determination from Kikuchi patterns	Morawiec, A.		1999	32	4	p. 788-798	article
9	DATPROC9: a data-processing program based on a new extension of the learnt-profile method	Gałdecka, E.		1999	32	4	p. 827-832	article
10	Deconvolution of the two-dimensional point-spread function of area detectors using the maximum-entropy algorithm	Graafsma, H.		1999	32	4	p. 683-691	article
11	Difference structure-factor normalization for heavy-atom or anomalous-scattering substructure determinations	Blessing, Robert H.		1999	32	4	p. 664-670	article
12	Direct analysis of small-angle smeared intensity tails. I. General results	Ciccariello, Salvino		1999	32	4	p. 579-589	article
13	Direct analysis of small-angle smeared intensity tails. II. Applications	Ciccariello, Salvino		1999	32	4	p. 590-599	article
14	DISCUS, a program for diffuse scattering and defect structure simulations – update	Proffen, Th.		1999	32	4	p. 838-839	article
15	Flat-specimen effect as a convolution in powder diffractometry with Bragg–Brentano geometry	Ida, T.		1999	32	4	p. 634-640	article
16	Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects	Scardi, Paolo		1999	32	4	p. 671-682	article
17	High-resolution transmission electron microscopy study of the ϕ′- and δ-AlON spinel phases of the pseudo-binary section AlN–Al2O3	Tabary, P.		1999	32	4	p. 755-760	article
18	Laboratory X-ray powder diffraction: a comparison of different geometries with special attention to the usage of the Cu Kα doublet	Heger, Gernot		1999	32	4	p. 799-807	article
19	Measurement of single-crystal elastic constants by neutron diffraction from polycrystals	Howard, C. J.		1999	32	4	p. 624-633	article
20	On the number of independent reflections in a powder diffraction pattern	David, W. I. F.		1999	32	4	p. 654-663	article
21	On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates	Machajdík, D.		1999	32	4	p. 736-743	article
22	Optimization of resolution–intensity balance in angular-dispersive powder diffractometry at a synchrotron radiation source	Grabcev, B.		1999	32	4	p. 641-653	article
23	Pepinsky's Machine: an interactive graphics-based Fourier synthesis program with applications in teaching and research	Glykos, Nicholas M.		1999	32	4	p. 821-823	article
24	PowderX: Windows-95-based program for powder X-ray diffraction data processing	Dong, Cheng		1999	32	4	p. 838	article
25	Quantitative phase analysis of α- and β-silicon nitrides. I. Estimation of errors	Toraya, H.		1999	32	4	p. 704-715	article
26	Quantitative phase analysis of α- and β-silicon nitrides. II. Round robins	Toraya, H.		1999	32	4	p. 716-729	article
27	Second-order neutron optics of three-axis spectrometers. I. Quasielastic scattering	Stoica, A. D.		1999	32	4	p. 744-754	article
28	Simulations of femtosecond X-ray diffraction from unperturbed and rapidly heated single crystals	Wark, J. S.		1999	32	4	p. 692-703	article
29	Structure of sodium para-hydroxybenzoate, NaO2C–C6H4OH by powder diffraction: application of a phenomenological model of anisotropic peak width	Dinnebier, R. E.		1999	32	4	p. 761-769	article
30	Use of an open-flow helium cryostat for macromolecular cryocrystallography	Hanson, B. Leif		1999	32	4	p. 814-820	article
31	WinGX suite for small-molecule single-crystal crystallography	Farrugia, Louis J.		1999	32	4	p. 837-838	article
32	XFPA98: a program for automatic structure determination and automatic refinement	Pavelcik, F.		1999	32	4	p. 839-840	article
33	X-ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments	Gualtieri, Alessandro F.		1999	32	4	p. 808-813	article

33 results found

Koninklijke Bibliotheek - National Library of the Netherlands