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X-ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments |
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Title: |
X-ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments |
Author: |
Gualtieri, Alessandro F. Mazzucato, Edoardo Venturelli, Paolo Viani, Alberto Zannini, Paolo Petras, Laszlo |
Appeared in: |
Journal of applied crystallography |
Paging: |
Volume 32 (1999) nr. 4 pages 808-813 |
Year: |
1999-08-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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