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On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates |
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Titel: |
On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates |
Auteur: |
Machajdík, D. Pevala, A. Rosová, A. Fröhlich, K. Šouc, J. Weiss, F. Figueras, A. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 32 (1999) nr. 4 pagina's 736-743 |
Jaar: |
1999-08-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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