| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A CMOS Ripple Detector for Voltage Regulator Testing
|
Nguyen, Hieu
|
|
2016
|
32 |
2 |
p. 227-233
|
artikel
|
| 2 |
A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores
|
Wali, I.
|
|
2016
|
32 |
2 |
p. 147-161
|
artikel
|
| 3 |
An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits
|
Nagamani, A. N.
|
|
2016
|
32 |
2 |
p. 175-196
|
artikel
|
| 4 |
Applications of Mixed-Signal Technology in Digital Testing
|
Li, Baohu
|
|
2016
|
32 |
2 |
p. 209-225
|
artikel
|
| 5 |
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets
|
Li, Yuanqing
|
|
2016
|
32 |
2 |
p. 137-145
|
artikel
|
| 6 |
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM
|
Luo, Kun-Lun
|
|
2016
|
32 |
2 |
p. 111-123
|
artikel
|
| 7 |
Design and Temperature Reliability Testing for A 0.6–2.14GHz Broadband Power Amplifier
|
Lin, Qian
|
|
2016
|
32 |
2 |
p. 235-240
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
2016
|
32 |
2 |
p. 107-108
|
artikel
|
| 9 |
Exemplar-based Failure Triage for Regression Design Debugging
|
Poulos, Zissis
|
|
2016
|
32 |
2 |
p. 125-136
|
artikel
|
| 10 |
Exploration of Noise Impact on Integrated Bulk Current Sensors
|
Melo, João Guilherme Mourão
|
|
2016
|
32 |
2 |
p. 163-173
|
artikel
|
| 11 |
New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-Building
|
Can, Yavuz
|
|
2016
|
32 |
2 |
p. 197-208
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
2016
|
32 |
2 |
p. 109-110
|
artikel
|
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