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Journal description
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Details for article 10 of 12 found articles
| Title: |
Exploration of Noise Impact on Integrated Bulk Current Sensors |
| Author: |
Melo, João Guilherme Mourão Sill Torres, Frank |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 32 (2016) nr. 2 pages 163-173 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 12 found articles
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