nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A doublet of 3 in. cylindrical silicon drift detectors in the CERES experiment
|
Faschingbauer, U. |
|
1996 |
377 |
2-3 |
p. 362-366 5 p. |
artikel |
2 |
A 55 em2 cylindrical silicon drift detector
|
Holl, P. |
|
1996 |
377 |
2-3 |
p. 367-374 8 p. |
artikel |
3 |
Analysis of trapping effects on charge transfer in proton irradiated pn-CCDs
|
Meidinger, Norbert |
|
1996 |
377 |
2-3 |
p. 298-311 14 p. |
artikel |
4 |
A new silicon drift detector with reduced lateral diffusion
|
Castoldi, A. |
|
1996 |
377 |
2-3 |
p. 375-380 6 p. |
artikel |
5 |
A transimpedance amplifier using a novel current mode feedback loop
|
Jarron, Pierre |
|
1996 |
377 |
2-3 |
p. 435-439 5 p. |
artikel |
6 |
Back-illuminated CCDs made by gas immersion laser doping
|
van den Berg, M.L. |
|
1996 |
377 |
2-3 |
p. 312-319 8 p. |
artikel |
7 |
CASTOR a VLSI CMOS mixed analog—digital circuit for low noise multichannel counting applications
|
Comes, G. |
|
1996 |
377 |
2-3 |
p. 440-445 6 p. |
artikel |
8 |
Conference summary
|
Damerell, C.J.S. |
|
1996 |
377 |
2-3 |
p. 539-546 8 p. |
artikel |
9 |
Damage-induced surface effects in silicon detectors
|
Wunstorf, R. |
|
1996 |
377 |
2-3 |
p. 290-297 8 p. |
artikel |
10 |
DC and noise performance of C-HFET transistors at low drain current densities
|
Karpinski, W. |
|
1996 |
377 |
2-3 |
p. 465-469 5 p. |
artikel |
11 |
Defects at the Si/SiO2 interface: Their nature and behaviour in technological processes and stress
|
Füssel, W. |
|
1996 |
377 |
2-3 |
p. 177-183 7 p. |
artikel |
12 |
Detection properties of LEC SI GaAs radiation detectors with the symmetrical contact configuration
|
Dubecký, F. |
|
1996 |
377 |
2-3 |
p. 475-478 4 p. |
artikel |
13 |
Detector calibration at the PTB radiometry laboratory at BESSY
|
Rabus, H. |
|
1996 |
377 |
2-3 |
p. 209-216 8 p. |
artikel |
14 |
Development of large linear silicon drift detectors for the STAR experiment at RHIC
|
Bellwied, R. |
|
1996 |
377 |
2-3 |
p. 387-392 6 p. |
artikel |
15 |
Double-sided “radiation resistant” microstrip detectors: Technology and results
|
Tonelli, G. |
|
1996 |
377 |
2-3 |
p. 422-428 7 p. |
artikel |
16 |
Effects of deep level defects in semiconductor detectors
|
Lutz, G. |
|
1996 |
377 |
2-3 |
p. 234-243 10 p. |
artikel |
17 |
Fabrication of large-area CCD detectors on high-purity, float-zone silicon
|
Gregory, J.A. |
|
1996 |
377 |
2-3 |
p. 325-333 9 p. |
artikel |
18 |
Fast tools for 3-D design problems in semiconductor detectors
|
Castoldi, A. |
|
1996 |
377 |
2-3 |
p. 381-386 6 p. |
artikel |
19 |
“Gate-to-gate” BJT obtained from the double-gate input JFET to reset charge preamplifiers
|
Fazzi, Alberto |
|
1996 |
377 |
2-3 |
p. 453-458 6 p. |
artikel |
20 |
Improving CdZnTe X-ray detector performance by cooling and rise time discrimination
|
Niemelä, A. |
|
1996 |
377 |
2-3 |
p. 484-486 3 p. |
artikel |
21 |
Intensified CCDs as position sensitive neutron detectors
|
Dietze, M. |
|
1996 |
377 |
2-3 |
p. 320-324 5 p. |
artikel |
22 |
Investigation on the N eff reverse annealing effect using TSC/I-DLTS: Relationship between neutron induced microscopic defects and silicon detector electrical degradations
|
Li, Z. |
|
1996 |
377 |
2-3 |
p. 265-275 11 p. |
artikel |
23 |
Investigations of donor and acceptor removal and long term annealing in silicon with different boron/phosphorus ratios
|
Wunstorf, R. |
|
1996 |
377 |
2-3 |
p. 228-233 6 p. |
artikel |
24 |
Irradiation tests of double-sided silicon strip detectors optimized for the ATLAS-inner-detector-region
|
Gößling, C. |
|
1996 |
377 |
2-3 |
p. 284-289 6 p. |
artikel |
25 |
Long term damage studies using silicon detectors fabricated from different starting materials and irradiated with neutrons, protons, and pions
|
Feick, H. |
|
1996 |
377 |
2-3 |
p. 217-223 7 p. |
artikel |
26 |
Low energy response of silicon pn-junction detector
|
Hartmann, R. |
|
1996 |
377 |
2-3 |
p. 191-196 6 p. |
artikel |
27 |
Low noise gamma-ray and X-ray detectors based on CdTe-materials
|
Åbro, E. |
|
1996 |
377 |
2-3 |
p. 470-474 5 p. |
artikel |
28 |
Material properties and room-temperature nuclear detector response of wide bandgap semiconductors
|
Schieber, M. |
|
1996 |
377 |
2-3 |
p. 492-495 4 p. |
artikel |
29 |
Modeling and characterization of a radiation sensitive p-channel transistor in a floating n-well
|
Erlebach, A. |
|
1996 |
377 |
2-3 |
p. 446-452 7 p. |
artikel |
30 |
Modelling the effects of electrical traps in radiation detectors
|
Kandiah, K. |
|
1996 |
377 |
2-3 |
p. 197-205 9 p. |
artikel |
31 |
Neutron induced defects in silicon detectors characterized by DLTS and TSC methods
|
Fretwurst, E. |
|
1996 |
377 |
2-3 |
p. 258-264 7 p. |
artikel |
32 |
New developments in the field of silicon detectors for digital radiology
|
Arfelli, F. |
|
1996 |
377 |
2-3 |
p. 508-513 6 p. |
artikel |
33 |
New pixel detector concepts based on junction field effect transistors on high resistivity silicon
|
Cesura, G. |
|
1996 |
377 |
2-3 |
p. 521-528 8 p. |
artikel |
34 |
Pair creation energy and Fano factor of silicon in the energy range of soft X-rays
|
Lechner, P. |
|
1996 |
377 |
2-3 |
p. 206-208 3 p. |
artikel |
35 |
Performance of a coaxial geometry Cd1−x Zn x Te detector
|
Lund, J.C. |
|
1996 |
377 |
2-3 |
p. 479-483 5 p. |
artikel |
36 |
Performance of large area proximity focused hybrid photo-diodes
|
Calvi, M. |
|
1996 |
377 |
2-3 |
p. 536-538 3 p. |
artikel |
37 |
Performance of the pn-CCD X-ray detector system designed for the XMM satellite mission
|
Soltau, H. |
|
1996 |
377 |
2-3 |
p. 340-345 6 p. |
artikel |
38 |
Photoconductors for 200–400 μm: Choices and challenges
|
Haegel, Nancy M. |
|
1996 |
377 |
2-3 |
p. 501-507 7 p. |
artikel |
39 |
Pion and proton induced radiation damage to silicon detectors
|
Riechmann, K. |
|
1996 |
377 |
2-3 |
p. 276-283 8 p. |
artikel |
40 |
Process- and irradiation-induced defects in silicon devices
|
Claeys, C. |
|
1996 |
377 |
2-3 |
p. 244-257 14 p. |
artikel |
41 |
P-type silicon drift detectors
|
Walton, J.T. |
|
1996 |
377 |
2-3 |
p. 357-361 5 p. |
artikel |
42 |
Radiation hardness of punch-through and FET biased silicon microstrip detectors
|
Westgaard, Trond I. |
|
1996 |
377 |
2-3 |
p. 429-434 6 p. |
artikel |
43 |
Readout of a Si strip detector with 200 μm pitch
|
Chochula, P. |
|
1996 |
377 |
2-3 |
p. 409-411 3 p. |
artikel |
44 |
Recent progress in Cd1−x Zn x Te radiation detectors
|
Parnham, Kevin B. |
|
1996 |
377 |
2-3 |
p. 487-491 5 p. |
artikel |
45 |
Recombination of nonequilibrium charge carriers in heavy ion tracks in silicon
|
Eremin, V.K. |
|
1996 |
377 |
2-3 |
p. 184-190 7 p. |
artikel |
46 |
Signal processing in the front-end electronics of BaBar vertex detector
|
Becker, R. |
|
1996 |
377 |
2-3 |
p. 459-464 6 p. |
artikel |
47 |
Silicon drift detectors for high resolution room temperature X-ray spectroscopy
|
Lechner, Peter |
|
1996 |
377 |
2-3 |
p. 346-351 6 p. |
artikel |
48 |
Silicon drift detector; studies about geometry of electrodes and production technology
|
Beolè, S. |
|
1996 |
377 |
2-3 |
p. 393-396 4 p. |
artikel |
49 |
Silicon drift detector with integrated p-JFET for continuous discharge of collected electrons through the gate junction
|
Bertuccio, G. |
|
1996 |
377 |
2-3 |
p. 352-356 5 p. |
artikel |
50 |
Strip detector design for ATLAS and HERA-B using two-dimensional device simulation
|
Richter, R.H. |
|
1996 |
377 |
2-3 |
p. 412-421 10 p. |
artikel |
51 |
Studies on a 300 k pixel detector telescope
|
Middelkamp, Peter |
|
1996 |
377 |
2-3 |
p. 532-535 4 p. |
artikel |
52 |
The application of high energy ion implantation for silicon radiation detectors
|
von Borany, J. |
|
1996 |
377 |
2-3 |
p. 514-520 7 p. |
artikel |
53 |
The effect of metal field plates on multiguard structures with floating p+ guard rings
|
Avset, Berit Sundby |
|
1996 |
377 |
2-3 |
p. 397-403 7 p. |
artikel |
54 |
The effect of radiation induced defects on the performance of high resistivity silicon diodes
|
Matheson, J. |
|
1996 |
377 |
2-3 |
p. 224-227 4 p. |
artikel |
55 |
Thermal imaging camera with linear Pb1−x Sn x Se-on-Si infrared sensor array and combined JFET/CMOS read-out electronics
|
Masek, J. |
|
1996 |
377 |
2-3 |
p. 496-500 5 p. |
artikel |
56 |
Transparent silicon strip sensors for the optical alignment of particle detector systems
|
Blum, W. |
|
1996 |
377 |
2-3 |
p. 404-408 5 p. |
artikel |
57 |
X-ray polarimetry — A novel application of CCDs
|
Bögner, M. |
|
1996 |
377 |
2-3 |
p. 529-531 3 p. |
artikel |
58 |
X-ray spectroscopy using MOS CCDs
|
Holland, A.D. |
|
1996 |
377 |
2-3 |
p. 334-339 6 p. |
artikel |