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Neutron induced defects in silicon detectors characterized by DLTS and TSC methods |
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Titel: |
Neutron induced defects in silicon detectors characterized by DLTS and TSC methods |
Auteur: |
Fretwurst, E. Dehn, C. Feick, H. Heydarpoor, P. Lindström, G. Moll, M. Schütze, C. Schulz, T. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 377 (1996) nr. 2-3 pagina's 7 p. |
Jaar: |
1996 |
Inhoud: |
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Uitgever: |
Elseiver Science B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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