nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Annealing behavior of high temperature implanted Fe impurities in n-InP
|
Cesca, T. |
|
2004 |
216 |
C |
p. 105-109 5 p. |
artikel |
2 |
Annealing of BaTiO3 thin films after heavy ion implantation
|
Dietrich, M. |
|
2004 |
216 |
C |
p. 110-115 6 p. |
artikel |
3 |
A positron beam study of hydrogen confined in nano-cavities in crystalline silicon
|
Schut, H |
|
2004 |
216 |
C |
p. 251-256 6 p. |
artikel |
4 |
A simple model for boron trapping by He implantation extended defects in Si: the role of boron diffusivity
|
Cayrel, F. |
|
2004 |
216 |
C |
p. 291-296 6 p. |
artikel |
5 |
Atomistic analysis of the ion beam induced defect evolution
|
Aboy, Maria |
|
2004 |
216 |
C |
p. 100-104 5 p. |
artikel |
6 |
Atomistic modeling of ion beam induced amorphization in silicon
|
Pelaz, Lourdes |
|
2004 |
216 |
C |
p. 41-45 5 p. |
artikel |
7 |
Author index
|
|
|
2004 |
216 |
C |
p. 415-423 9 p. |
artikel |
8 |
Buried silicon dioxide formation in a precursor nanocavity layer in Si
|
van Veen, A. |
|
2004 |
216 |
C |
p. 264-268 5 p. |
artikel |
9 |
Cathodoluminescence of α-quartz after hot Ge ion irradiation
|
Sahoo, P.K. |
|
2004 |
216 |
C |
p. 324-328 5 p. |
artikel |
10 |
Chemically guided epitaxy of Rb-ion amorphized α-quartz: the roles of Rb and oxygen
|
Gąsiorek, S. |
|
2004 |
216 |
C |
p. 62-66 5 p. |
artikel |
11 |
Combinatorial ion implantation – a smart technique applied to synthesize CdSe-nanocrystals
|
Großhans, I. |
|
2004 |
216 |
C |
p. 396-401 6 p. |
artikel |
12 |
Comparative analysis of the implantation-induced structural modifications in GaAs and Ge
|
Desnica-Frankovic, I.D. |
|
2004 |
216 |
C |
p. 318-323 6 p. |
artikel |
13 |
Comparison of thermally and mechanically induced Si layer transfer in hydrogen-implanted Si wafers
|
Höchbauer, T. |
|
2004 |
216 |
C |
p. 257-263 7 p. |
artikel |
14 |
Contents
|
|
|
2004 |
216 |
C |
p. ix-xii nvt p. |
artikel |
15 |
Coupling of atom-by-atom calculations of extended defects with B kick-out equations: application to the simulation of boron ted
|
Lampin, E. |
|
2004 |
216 |
C |
p. 95-99 5 p. |
artikel |
16 |
Damage accumulation and dopant migration during shallow As and Sb implantation into Si
|
Werner, M. |
|
2004 |
216 |
C |
p. 67-74 8 p. |
artikel |
17 |
Depth dependence of defect evolution and TED during annealing
|
Colombeau, B. |
|
2004 |
216 |
C |
p. 90-94 5 p. |
artikel |
18 |
Diffusion of ion beam injected self-interstitial defects in silicon layers grown by molecular beam epitaxy
|
De Salvador, D. |
|
2004 |
216 |
C |
p. 286-290 5 p. |
artikel |
19 |
Diffusion simulations of boron implanted at low energy (500 eV) in crystalline silicon
|
Ihaddadene-Le Coq, L. |
|
2004 |
216 |
C |
p. 303-307 5 p. |
artikel |
20 |
Direct evidence of the recombination of silicon interstitial atoms at the silicon surface
|
Lamrani, Y. |
|
2004 |
216 |
C |
p. 281-285 5 p. |
artikel |
21 |
Direct ion beam synthesis of II–VI nanocrystals
|
Desnica, U.V |
|
2004 |
216 |
C |
p. 407-413 7 p. |
artikel |
22 |
Editorial board
|
|
|
2004 |
216 |
C |
p. IFC- 1 p. |
artikel |
23 |
Effect of diffusion on ion beam-synthesized PbS nanocrystals
|
Espiau de Lamaestre, R. |
|
2004 |
216 |
C |
p. 402-406 5 p. |
artikel |
24 |
Effect of substrate orientation on defect generation and annealing behaviour in carbon implanted silicon
|
Häberlen, M. |
|
2004 |
216 |
C |
p. 36-40 5 p. |
artikel |
25 |
Electroluminescence properties of SiO x layers implanted with rare earth ions
|
Irrera, A. |
|
2004 |
216 |
C |
p. 222-227 6 p. |
artikel |
26 |
Ellipsometric spectroscopy study of Ar ion-beam mixed SiO2/Si/SiO2 layers
|
Kim, H.B. |
|
2004 |
216 |
C |
p. 367-371 5 p. |
artikel |
27 |
Elongated Co nanoparticles induced by swift heavy ion irradiations
|
D’Orléans, C. |
|
2004 |
216 |
C |
p. 372-378 7 p. |
artikel |
28 |
Finite size effects in phase transformation kinetics in thin films and surface layers
|
Trofimov, Vladimir I. |
|
2004 |
216 |
C |
p. 334-339 6 p. |
artikel |
29 |
Fluence dependence and thermal stability of defects in helium-implanted cubic zirconia
|
Saudé, S. |
|
2004 |
216 |
C |
p. 156-160 5 p. |
artikel |
30 |
Formation and dissociation of Zn nanoclusters in MgO
|
van Huis, M.A. |
|
2004 |
216 |
C |
p. 390-395 6 p. |
artikel |
31 |
Formation, growth and dissociation of He bubbles in Al2O3
|
van Huis, M.A. |
|
2004 |
216 |
C |
p. 149-155 7 p. |
artikel |
32 |
Formation of CdSe nanoclusters in MgO by ion beam synthesis
|
van Huis, M.A. |
|
2004 |
216 |
C |
p. 121-126 6 p. |
artikel |
33 |
FTIR and Vis–FUV real time spectroscopic ellipsometry studies of polymer surface modifications during ion beam bombardment
|
Laskarakis, A. |
|
2004 |
216 |
C |
p. 131-136 6 p. |
artikel |
34 |
Helium diffusion in metals investigated by nuclear reaction analysis
|
Flament, J.L. |
|
2004 |
216 |
C |
p. 161-166 6 p. |
artikel |
35 |
Ion beam induced coherent displacement in Al on Au system
|
Peltola, J |
|
2004 |
216 |
C |
p. 308-312 5 p. |
artikel |
36 |
Ion-beam induced defects and nanoscale amorphous clusters in silicon carbide
|
Weber, W.J |
|
2004 |
216 |
C |
p. 25-35 11 p. |
artikel |
37 |
Ion beam induced defects in crystalline silicon
|
Cristiano, F |
|
2004 |
216 |
C |
p. 46-56 11 p. |
artikel |
38 |
Ion-beam induced modification of pores array in anodic alumina
|
Cherenda, N.N. |
|
2004 |
216 |
C |
p. 340-345 6 p. |
artikel |
39 |
Ion beam synthesis of Co nanoparticles in SiO2: Monte Carlo simulation
|
Cerruti, C. |
|
2004 |
216 |
C |
p. 329-333 5 p. |
artikel |
40 |
Ion bombardment induced morphology modifications on self-organized semiconductor surfaces
|
Hofer, C. |
|
2004 |
216 |
C |
p. 178-184 7 p. |
artikel |
41 |
Ion induced precipitation of metal particles in triethoxysilane for optical and magnetic applications
|
Pivin, J.C. |
|
2004 |
216 |
C |
p. 239-244 6 p. |
artikel |
42 |
Irradiation effects in carbon nanotubes
|
Krasheninnikov, A.V. |
|
2004 |
216 |
C |
p. 355-366 12 p. |
artikel |
43 |
Magnetic modifications of thin CoFe films induced by Xe+-ion irradiation
|
Gupta, Ratnesh |
|
2004 |
216 |
C |
p. 350-354 5 p. |
artikel |
44 |
Mechanical properties of pulsed laser-deposited hydroxyapatite thin film implanted at high energy with N+ and Ar+ ions. Part I: nanoindentation with spherical tipped indenter
|
Pelletier, H. |
|
2004 |
216 |
C |
p. 269-274 6 p. |
artikel |
45 |
Mechanical properties of pulsed laser-deposited hydroxyapatite thin films implanted at high energy with N+ and Ar+ ions. Part II: nano-scratch tests with spherical tipped indenter
|
Pelletier, H. |
|
2004 |
216 |
C |
p. 275-280 6 p. |
artikel |
46 |
Microstructure of β-FeSi2 buried layers synthesis by ion implantation
|
Ayache, R. |
|
2004 |
216 |
C |
p. 137-142 6 p. |
artikel |
47 |
Microstructure of N+ ion beam induced epitaxial crystallized Si
|
Sahoo, P.K. |
|
2004 |
216 |
C |
p. 313-317 5 p. |
artikel |
48 |
Nanocrystals manufacturing by ultra-low-energy ion-beam-synthesis for non-volatile memory applications
|
Normand, P. |
|
2004 |
216 |
C |
p. 228-238 11 p. |
artikel |
49 |
Nitrogen distribution during oxidation of low and medium energy nitrogen-implanted silicon
|
Skarlatos, D. |
|
2004 |
216 |
C |
p. 75-79 5 p. |
artikel |
50 |
n-ZnO/p-Si photodiodes fully isolated by B+ ion-implantation
|
Park, C.H. |
|
2004 |
216 |
C |
p. 127-130 4 p. |
artikel |
51 |
Optical and electrical properties of Si-nanocrystals ion beam synthesized in SiO2
|
Garrido, B. |
|
2004 |
216 |
C |
p. 213-221 9 p. |
artikel |
52 |
Optical study of Si nanocrystals in Si/SiO2 layers by spectroscopic ellipsometry
|
En Naciri, A. |
|
2004 |
216 |
C |
p. 167-172 6 p. |
artikel |
53 |
Optimization of InGaAs/InP MHBT and HBT’s technology: control and modeling of beryllium diffusion phenomena
|
Ihaddadene-Lenglet, M. |
|
2004 |
216 |
C |
p. 297-302 6 p. |
artikel |
54 |
Physical properties and structure of thin ion-beam modified polymer films
|
Guenther, M |
|
2004 |
216 |
C |
p. 143-148 6 p. |
artikel |
55 |
Roughness evolution of some X-UV reflective materials induced by low energy (<1 keV) ion beam milling
|
Gailly, P |
|
2004 |
216 |
C |
p. 206-212 7 p. |
artikel |
56 |
Self-interstitial diffusion and clustering with impurities in crystalline silicon
|
Mirabella, S. |
|
2004 |
216 |
C |
p. 80-89 10 p. |
artikel |
57 |
Slow highly charged ions for nanoscale surface modifications
|
Kentsch, U |
|
2004 |
216 |
C |
p. 196-201 6 p. |
artikel |
58 |
Sputtering of binary crystal surface under grazing ion bombardment
|
Dzhurakhalov, A.A. |
|
2004 |
216 |
C |
p. 202-205 4 p. |
artikel |
59 |
Structural and magnetic properties of Fe–Al silica composites prepared by sequential ion implantation
|
de Julián Fernández, C. |
|
2004 |
216 |
C |
p. 245-250 6 p. |
artikel |
60 |
Surface modification with gas cluster ion beams from fundamental characteristics to applications
|
Toyoda, N. |
|
2004 |
216 |
C |
p. 379-389 11 p. |
artikel |
61 |
Surface smoothing with large current cluster ion beam
|
Seki, T. |
|
2004 |
216 |
C |
p. 191-195 5 p. |
artikel |
62 |
Surface structure dependence of impact processes of gas cluster ions
|
Aoki, Takaaki |
|
2004 |
216 |
C |
p. 185-190 6 p. |
artikel |
63 |
Symposium E on Ion Beams for Nanoscale Surface Modifications
|
Claverie, A. |
|
2004 |
216 |
C |
p. vii-viii nvt p. |
artikel |
64 |
The laser annealing induced phase transition in silicon: a molecular dynamics study
|
Marqués, Luis A. |
|
2004 |
216 |
C |
p. 57-61 5 p. |
artikel |
65 |
Thermal evolution of {113} defects in silicon: transformation against dissolution
|
Calvo, P |
|
2004 |
216 |
C |
p. 173-177 5 p. |
artikel |
66 |
The shape and ordering of self-organized nanostructures by ion sputtering
|
Frost, F. |
|
2004 |
216 |
C |
p. 9-19 11 p. |
artikel |
67 |
Thick elevation of silicon on patterned structure using ion implantation induced selective etching
|
Huda, M.Q. |
|
2004 |
216 |
C |
p. 20-24 5 p. |
artikel |
68 |
Track formation and fabrication of nanostructures with MeV-ion beams
|
Toulemonde, M |
|
2004 |
216 |
C |
p. 1-8 8 p. |
artikel |
69 |
Visible photoluminescence from Si ion-beam-mixed SiO2/Si/SiO2 layers deposited by e-beam evaporation
|
Son, J.H. |
|
2004 |
216 |
C |
p. 346-349 4 p. |
artikel |
70 |
ZnTe nanoparticles formed by ion implantation in a SiO2 layer on silicon
|
Chemam, R. |
|
2004 |
216 |
C |
p. 116-120 5 p. |
artikel |