nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An evaluation of the voltage-current rating characteristics of miniature monolithic RF ceramic capacitors
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
2 |
A new electroless method for low-loss microwave integrated circuits
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
3 |
A realistic approach to thick film resistor design
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
4 |
A small scale silicon epitaxial film deposition system
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
5 |
Automatic alignment for direct step and repeat printing on silicon
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
6 |
Characteristics of an indium-tin oxide transparent conductor deposited from organometallic compositions
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
7 |
Characterization and morphology of chemical vapour deposition of silicon
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
8 |
Chip-module package interfaces
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
9 |
C-MOS on sapphire sparks small computer's performance
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
10 |
Conduction properties of lightly doped, polycrystalline silicon
|
|
|
1980 |
11 |
4 |
p. 41-42 2 p. |
artikel |
11 |
Contact noise in thick film resistors
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
12 |
Control of pre-trim variables in thick film resistor processing
|
|
|
1980 |
11 |
4 |
p. 40-41 2 p. |
artikel |
13 |
Design of wide band amplifiers using hybrid integrated techniques
|
|
|
1980 |
11 |
4 |
p. 37- 1 p. |
artikel |
14 |
Determination of surface state distribution from pulsed MOS capacitor transients
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
15 |
Editorial
|
Butcher, John |
|
1980 |
11 |
4 |
p. 3- 1 p. |
artikel |
16 |
Effect of reactive gas dopants on the MgP surface in AC plasma display panels
|
|
|
1980 |
11 |
4 |
p. 39-40 2 p. |
artikel |
17 |
Elastic and inelastic scattering of electrons by vibrating impurities in semiconductors
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
18 |
Electrical conduction in thin zinc rf sputtered films
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
19 |
Electrical properties of the MIS capacitor under illumination
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
20 |
Epoxies for component mounting in thick film hybrids
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
21 |
Evaluation of adhesives for hybrid microcircuit package sealing
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
22 |
Extreme temperature range microelectronics
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
23 |
Ferromagnetic resonance in strained and strain-free single crystal nickel films
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
24 |
Flicker noise in MOSFETs made by the DMOS process
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
25 |
Frequency dependent propagation delay in silicon-on-sapphire digital integrated circuits
|
|
|
1980 |
11 |
4 |
p. 37- 1 p. |
artikel |
26 |
Gang bonding to standard aluminized integrated circuits with bumped interconnect tape
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
27 |
Hall effect measurements of flash evaporated cadmium sulphide thin films
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
28 |
High density raises sights of ECL design
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
29 |
High speed functional testing of microprocessor based boards
|
Skingley, D.A. |
|
1980 |
11 |
4 |
p. 31-33 3 p. |
artikel |
30 |
Infrared high spatial-resolution determination of doping levels in p-n junctions
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
31 |
Laser drilling of vias in dielectric for high density multilayer thick film circuits
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
32 |
Lead forming and outer lead bond pattern design for tape-bonded hybrids
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
33 |
Measurement of the lattice constant of Si-Ge hetero-epitaxial layers grown on a silicon substrate
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
34 |
Microelectronics on the road to VLSI technique. Part 1: Procedural steps
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
35 |
Molecular beam epitaxy
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
36 |
New gallium arsenide oxidation technique for microwave integrated circuits
|
|
|
1980 |
11 |
4 |
p. 37- 1 p. |
artikel |
37 |
New substrate causes a stir
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
38 |
Non uniform recombination in thin silicon-on-sapphire films
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
39 |
[No title]
|
Anand, K.V. |
|
1980 |
11 |
4 |
p. 43- 1 p. |
artikel |
40 |
[No title]
|
Manden, A.F. |
|
1980 |
11 |
4 |
p. 44- 1 p. |
artikel |
41 |
[No title]
|
Weatherley, R.T. |
|
1980 |
11 |
4 |
p. 44- 1 p. |
artikel |
42 |
[No title]
|
Weatherley, R.T. |
|
1980 |
11 |
4 |
p. 44- 1 p. |
artikel |
43 |
[No title]
|
Free, C. |
|
1980 |
11 |
4 |
p. 43- 1 p. |
artikel |
44 |
Numerical analysis of electric semiconductor structures
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
45 |
Observations of dislocations and junction irregularities in bipolar transistors using the E.B.I.C. mode of the scanning electron microscope
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
46 |
On the control of MOSFET threshold voltage variation for the production of LSI devices
|
Maddox, R.L. |
|
1980 |
11 |
4 |
p. 4-19 16 p. |
artikel |
47 |
Photocurrents in silicon nitride films
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
48 |
64-pin QUIP keeps microprocessor chips cool and accessible
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
49 |
Practical troubleshooting of vacuum deposition processes and equipment for aluminum metalization
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
50 |
Process oriented simulation of integrated transistors
|
Antognetti, P. |
|
1980 |
11 |
4 |
p. 20-23 4 p. |
artikel |
51 |
Radiation-hardened CMOS integrated circuits
|
Pikor, A. |
|
1980 |
11 |
4 |
p. 27-30 4 p. |
artikel |
52 |
Reactive sputter etching of thin films for pattern delincation
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
53 |
Reducing post-trim drift of thin-film resistors by optimizing YAG laser output characteristics
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
54 |
Resistor grids in hybrid circuits
|
Bapeswara Rao, V.V. |
|
1980 |
11 |
4 |
p. 24-26 3 p. |
artikel |
55 |
Scanning photocurrent microscopy: A new technique to study inhomogeneously distributed recombination centers in semiconductors
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
56 |
The design of microcomputer systems
|
|
|
1980 |
11 |
4 |
p. 37- 1 p. |
artikel |
57 |
The kinetics of open tube phosphorus diffusion in silicon
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
58 |
The microprocessor in video editing
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |
59 |
The preparation, structure and properties of Pb0.82Sn0.18 Te films obtained by modified hot-wall evaporation technique
|
|
|
1980 |
11 |
4 |
p. 39- 1 p. |
artikel |
60 |
Thermal oxidation of silicon using trichloroethylene
|
|
|
1980 |
11 |
4 |
p. 40- 1 p. |
artikel |
61 |
Thermocompression bondability of bare copper leads
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
62 |
Thick film distributed notch filters
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
63 |
Thin-film layers shrink rf inductors to chip size
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
64 |
Thinning method for electron microscopy transparent silicon and germanium foils
|
|
|
1980 |
11 |
4 |
p. 41- 1 p. |
artikel |
65 |
Time dependence of ion-migration effects in NiCr resistor films
|
|
|
1980 |
11 |
4 |
p. 38- 1 p. |
artikel |
66 |
Tunable infra-red semiconductor diode lasers
|
Gibson, J.A. |
|
1980 |
11 |
4 |
p. 34-36 3 p. |
artikel |
67 |
Use of microprocessors in multiple-processor systems
|
|
|
1980 |
11 |
4 |
p. 42- 1 p. |
artikel |