| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A method to protect Cuckoo filters from soft errors
|
Reviriego, P.
|
|
2017
|
72 |
C |
p. 85-89
5 p.
|
artikel
|
| 2 |
A new erase method for scaled NAND flash memory device
|
Lin, Chan-Ching
|
|
2017
|
72 |
C |
p. 34-38
5 p.
|
artikel
|
| 3 |
1D and Q2D thermal resistance analysis of micro channel structure and flat plate heat pipe
|
Chen, Shao-Wen
|
|
2017
|
72 |
C |
p. 103-114
12 p.
|
artikel
|
| 4 |
Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits
|
Tadeusiewicz, Michał
|
|
2017
|
72 |
C |
p. 90-97
8 p.
|
artikel
|
| 5 |
Discrete phase method study of ball grid array underfill process using nano-silica filler-reinforced composite-encapsulant with varying filler loadings
|
Ng, Fei Chong
|
|
2017
|
72 |
C |
p. 45-64
20 p.
|
artikel
|
| 6 |
Editorial Board
|
|
|
2017
|
72 |
C |
p. IFC-
1 p.
|
artikel
|
| 7 |
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices
|
Yamaguchi, Shimpei
|
|
2017
|
72 |
C |
p. 80-84
5 p.
|
artikel
|
| 8 |
Experimental and numerical investigation of flow and thermal effects on flexible printed circuit board
|
Lim, C.H.
|
|
2017
|
72 |
C |
p. 5-17
13 p.
|
artikel
|
| 9 |
Exploration of baking temperature effects on 28nm BEOL reliability
|
Zhao, XiangFu
|
|
2017
|
72 |
C |
p. 1-4
4 p.
|
artikel
|
| 10 |
Fast and accurate method of lifetime estimation for HfSiON/SiO2 dielectric n-MOSFETs under positive bias temperature instability
|
Roh, Giyoun
|
|
2017
|
72 |
C |
p. 98-102
5 p.
|
artikel
|
| 11 |
Influence of carrier lifetime distribution on the current filament in high voltage diode
|
Zhang, Lei
|
|
2017
|
72 |
C |
p. 75-79
5 p.
|
artikel
|
| 12 |
Metal defect localization of GaAs or Si based ICs by dynamic emission microscopy
|
Chen, Xuanlong
|
|
2017
|
72 |
C |
p. 24-29
6 p.
|
artikel
|
| 13 |
Performance deterioration of p-type single crystalline silicon solar modules affected by potential induced degradation in photovoltaic power plant
|
Yang, Hong
|
|
2017
|
72 |
C |
p. 18-23
6 p.
|
artikel
|
| 14 |
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology
|
Wang, Haibin
|
|
2017
|
72 |
C |
p. 39-44
6 p.
|
artikel
|
| 15 |
Simulation of LED based luminaires by using multi-domain compact models of LEDs and compact thermal models of their thermal environment
|
Poppe, András
|
|
2017
|
72 |
C |
p. 65-74
10 p.
|
artikel
|
| 16 |
Temperature impact on inductance and resistance values of a coreless inductor (Cu/Al2O3)
|
Doumit, N.
|
|
2017
|
72 |
C |
p. 30-33
4 p.
|
artikel
|
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