| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Aging comparative analysis of high-performance FinFET and CMOS flip-flops
|
Taghipour, Shiva
|
|
2017
|
69 |
C |
p. 52-59
8 p.
|
artikel
|
| 2 |
A modified boost rectifier for elimination of circulating current in power factor correction applications
|
Venkitusamy, Karthikeyan
|
|
2017
|
69 |
C |
p. 29-35
7 p.
|
artikel
|
| 3 |
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation
|
Khan, Saqib Ali
|
|
2017
|
69 |
C |
p. 100-108
9 p.
|
artikel
|
| 4 |
An enhanced MOSFET threshold voltage model for the 6–300K temperature range
|
Dao, Nguyen Cong
|
|
2017
|
69 |
C |
p. 36-39
4 p.
|
artikel
|
| 5 |
A perspective of the IPC report on lead-free electronics in military/aerospace applications
|
Fortier, Aleksandra
|
|
2017
|
69 |
C |
p. 66-70
5 p.
|
artikel
|
| 6 |
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters
|
Ortiz-Conde, Adelmo
|
|
2017
|
69 |
C |
p. 1-16
16 p.
|
artikel
|
| 7 |
Comments on “Extend orthogonal Latin square codes for 32-bit data protection in memory applications” Microelectron. Reliab. 63, 278–283 (2016)
|
Liu, Shanshan
|
|
2017
|
69 |
C |
p. 126-129
4 p.
|
artikel
|
| 8 |
Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40nm floating gate embedded-flash memory
|
Dobri, Adam
|
|
2017
|
69 |
C |
p. 47-51
5 p.
|
artikel
|
| 9 |
Editorial Board
|
|
|
2017
|
69 |
C |
p. IFC-
1 p.
|
artikel
|
| 10 |
Effects of finger dimension on low-frequency noise and optoelectronic properties of Ge metal-semiconductor-metal photodetectors with interdigitated Pt finger electrodes
|
Zumuukhorol, Munkhsaikhan
|
|
2017
|
69 |
C |
p. 60-65
6 p.
|
artikel
|
| 11 |
Effects of temperature and span amplitude on fretting corrosion behavior of tin-plated electrical contacts
|
Kim, Min-Jung
|
|
2017
|
69 |
C |
p. 80-87
8 p.
|
artikel
|
| 12 |
Emulation-based fault analysis on RFID tags for robustness and security evaluation
|
Mezzah, Ibrahim
|
|
2017
|
69 |
C |
p. 115-125
11 p.
|
artikel
|
| 13 |
Optimization of the thermal contact resistance within press pack IGBTs
|
Deng, Erping
|
|
2017
|
69 |
C |
p. 17-28
12 p.
|
artikel
|
| 14 |
Semiconductor package qualification based on the swelling temperature
|
Song, K.H.
|
|
2017
|
69 |
C |
p. 71-79
9 p.
|
artikel
|
| 15 |
Single event double node upset tolerance in MOS/spintronic sequential and combinational logic circuits
|
Rajaei, Ramin
|
|
2017
|
69 |
C |
p. 109-114
6 p.
|
artikel
|
| 16 |
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device
|
Lee, Hosung
|
|
2017
|
69 |
C |
p. 88-99
12 p.
|
artikel
|
| 17 |
The role of electronic energy loss in SHI irradiated Ni/oxide/n-GaP Schottky diode
|
Shiwakoti, N.
|
|
2017
|
69 |
C |
p. 40-46
7 p.
|
artikel
|
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