Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             40 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adaptive reliability satisfaction in wireless sensor networks through controlling the number of active routing paths Alirezaeyan, Javad
2015
55 11 p. 2412-2422
11 p.
artikel
2 Adhesion energy of printed circuit board materials using four-point-bending validated with finite element simulations Schöngrundner, R.
2015
55 11 p. 2382-2390
9 p.
artikel
3 A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module Rajaguru, Pushparajah
2015
55 11 p. 2371-2381
11 p.
artikel
4 Characterising Arrhenius moisture diffusivity constants using non-isothermal sorption Wong, E.H.
2015
55 11 p. 2331-2335
5 p.
artikel
5 Coupling effects of mechanical vibrations and thermal cycling on reliability of CCGA solder joints Ding, Ying
2015
55 11 p. 2396-2402
7 p.
artikel
6 Crossbar array of selector-less TaO x /TiO2 bilayer RRAM Chou, Chun-Tse
2015
55 11 p. 2220-2223
4 p.
artikel
7 Cross-layer custom instruction selection to address PVTA variations and soft error Farahani, Bahar
2015
55 11 p. 2423-2438
16 p.
artikel
8 Cu–Al intermetallic compound investigation using ex-situ post annealing and in-situ annealing Tan, Y.Y.
2015
55 11 p. 2316-2323
8 p.
artikel
9 Design and characterization of ESD solutions with EMC robustness for automotive applications Xi, Yunfeng
2015
55 11 p. 2236-2246
11 p.
artikel
10 Design optimization of RF-MEMS switch considering thermally induced residual stress and process uncertainties Saleem, Muhammad Mubasher
2015
55 11 p. 2284-2298
15 p.
artikel
11 Design space exploration of non-uniform cache access for soft-error vulnerability mitigation Maghsoudloo, Mohammad
2015
55 11 p. 2439-2452
14 p.
artikel
12 Editorial Liou, Juin J.
2015
55 11 p. 2173-
1 p.
artikel
13 Editorial Board 2015
55 11 p. IFC-
1 p.
artikel
14 Effect of elevated temperature on PCB responses and solder interconnect reliability under vibration loading Zhang, H.W.
2015
55 11 p. 2391-2395
5 p.
artikel
15 Fabrication of TiO2 compact layer precursor at various reaction times for dye sensitized solar cells Chou, Hsueh-Tao
2015
55 11 p. 2208-2212
5 p.
artikel
16 Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature Chi, Wei-Fong
2015
55 11 p. 2183-2187
5 p.
artikel
17 20GHz on-chip measurement of ESD waveform for system level analysis Caignet, F.
2015
55 11 p. 2276-2283
8 p.
artikel
18 Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment Wang, Shea-Jue
2015
55 11 p. 2203-2207
5 p.
artikel
19 Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps Sasikumar, A.
2015
55 11 p. 2258-2262
5 p.
artikel
20 Impact of laminate cracks under solder pads on the fatigue lives of ball grid array solder joints Tegehall, Per-Erik
2015
55 11 p. 2354-2370
17 p.
artikel
21 Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2 Lee, Hao-Chieh
2015
55 11 p. 2178-2182
5 p.
artikel
22 Improving retention properties by thermal imidization for polyimide-based nonvolatile resistive random access memories Hsiao, Yu-Ping
2015
55 11 p. 2188-2197
10 p.
artikel
23 Increasing the cycle life of lithium ion cells by partial state of charge cycling de Vries, Hans
2015
55 11 p. 2247-2253
7 p.
artikel
24 Induced thermo-mechanical reliability of copper-filled TSV interposer by transient selective annealing technology Lee, Chang-Chun
2015
55 11 p. 2213-2219
7 p.
artikel
25 In situ fixture for multi-modal characterization during electromigration and thermal testing of wire-like microscale specimens Mertens, James C.E.
2015
55 11 p. 2345-2353
9 p.
artikel
26 Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process Lin, Chun-Yu
2015
55 11 p. 2229-2235
7 p.
artikel
27 Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics Lin, K.C.
2015
55 11 p. 2198-2202
5 p.
artikel
28 Microstructural evaluation and failure analysis of Ag wire bonded to Al pads Choi, Mi-Ri
2015
55 11 p. 2306-2315
10 p.
artikel
29 Microstructure and morphology of interfacial intermetallic compound CoSn3 in Sn–Pb/Co–P solder joints Yang, Guoshuai
2015
55 11 p. 2403-2411
9 p.
artikel
30 [No title] Gan, Chong Leong
2015
55 11 p. 2481-
1 p.
artikel
31 On endurance and performance of erasure codes in SSD-based storage systems Alinezhad Chamazcoti, Saeideh
2015
55 11 p. 2453-2467
15 p.
artikel
32 Probabilistic analysis of dynamic and temporal fault trees using accurate stochastic logic gates Cheshmikhani, Elham
2015
55 11 p. 2468-2480
13 p.
artikel
33 Process optimization of RTA on the characteristics of ITO-coated GaN-based LEDs Hao, H.L.
2015
55 11 p. 2263-2268
6 p.
artikel
34 Reliability investigations on LIFT-printed isotropic conductive adhesive joints for system-in-foil applications Sridhar, Ashok
2015
55 11 p. 2324-2330
7 p.
artikel
35 Research on lumen depreciation related to LED packages by in-situ measurement method Quan, Chen
2015
55 11 p. 2269-2275
7 p.
artikel
36 Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy Lin, Shih-Hung
2015
55 11 p. 2224-2228
5 p.
artikel
37 The effect of various concentrations of PVDF-HFP polymer gel electrolyte for dye-sensitized solar cell Chou, Hsueh-Tao
2015
55 11 p. 2174-2177
4 p.
artikel
38 Time-domain viscoelastic constitutive model based on concurrent fitting of frequency-domain characteristics Chiu, Tz-Cheng
2015
55 11 p. 2336-2344
9 p.
artikel
39 Ultra sensitive measurement of dielectric current under pulsed stress conditions Helfmeier, Clemens
2015
55 11 p. 2254-2257
4 p.
artikel
40 Zinc oxide-praseodymia semiconducting varistors having a powerful surge suppression capability Nahm, Choon-W.
2015
55 11 p. 2299-2305
7 p.
artikel
                             40 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland