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Journal description
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Details for article 3 of 40 found articles
| Title: |
A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module |
| Author: |
Rajaguru, Pushparajah Lu, Hua Bailey, Chris |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 11 pages 11 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 40 found articles
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