nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An efficient approach to the measurement and characterization of MOSFET capacitances
|
Sadowski, M |
|
2000 |
40 |
6 |
p. 1045-1049 5 p. |
artikel |
2 |
A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures
|
Bing, Xie |
|
2000 |
40 |
6 |
p. 1039-1043 5 p. |
artikel |
3 |
Backside probing of flip–chip circuits using electrostatic force sampling
|
Qi, R |
|
2000 |
40 |
6 |
p. 997-1003 7 p. |
artikel |
4 |
Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit
|
Maouad, A |
|
2000 |
40 |
6 |
p. 973-979 7 p. |
artikel |
5 |
Comments on “Reliability and component importance of a consecutive-k-out-of-n system” by Zuo
|
Hwang, Frank K. |
|
2000 |
40 |
6 |
p. 1061-1063 3 p. |
artikel |
6 |
Computationally efficient large-change statistical analysis of linear electronic circuits
|
Ilić, T. |
|
2000 |
40 |
6 |
p. 1023-1038 16 p. |
artikel |
7 |
Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design
|
Takeda, Eiji |
|
2000 |
40 |
6 |
p. 897-908 12 p. |
artikel |
8 |
Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
|
Mouthaan, A.J |
|
2000 |
40 |
6 |
p. 909-917 9 p. |
artikel |
9 |
Design-for-test for Digital ICs and Embedded Core Systems; Alfred L. Crouch. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, hardcover, p. 349, CD ROM included, ISBN: 0-13-084827-1, $80,50.
|
Stojcev, M |
|
2000 |
40 |
6 |
p. 1065- 1 p. |
artikel |
10 |
Electrical stress and plasma-induced traps in SiO2
|
Paskaleva, A. |
|
2000 |
40 |
6 |
p. 933-940 8 p. |
artikel |
11 |
High performance a-Si:H thin film transistors based on aluminum gate metallization
|
Nathan, A |
|
2000 |
40 |
6 |
p. 947-953 7 p. |
artikel |
12 |
High Performance Cluster Computing vol. I & II; Rajkumar Buyya ed. Prentice Hall PTR, Upper Saddle River, NJ 07458, 1999, Hardcover, vol. I. p. 849, $55.50, vol. II, p. 664, $55.50, ISBN: 0-13-013784-7 for vol. I, 0-13-013785-5 for vol. II
|
Stojcev, M |
|
2000 |
40 |
6 |
p. 1066-1067 2 p. |
artikel |
13 |
Logic and Computer Design Fundamentals; 2 ed.; Morris Mans, Charles Kime. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, 2000, paperbound, p. 652, CD ROMs included, ISBN: 0-13-016176-4, $48.99.
|
Stojcev, M |
|
2000 |
40 |
6 |
p. 1065-1066 2 p. |
artikel |
14 |
Mechanisms of noise sources in microelectromechanical systems
|
Djurić, Zoran |
|
2000 |
40 |
6 |
p. 919-932 14 p. |
artikel |
15 |
Modeling early failure in integrated circuit interconnect
|
Tekleab, Daniel |
|
2000 |
40 |
6 |
p. 991-996 6 p. |
artikel |
16 |
Module allocation for on-line testing
|
Ismaeel, A.A |
|
2000 |
40 |
6 |
p. 1011-1021 11 p. |
artikel |
17 |
New challenges to the modelling and electrical characterisation of ohmic contacts for ULSI devices
|
Holland, A.S |
|
2000 |
40 |
6 |
p. 965-971 7 p. |
artikel |
18 |
Predictive densities for the lognormal distribution and their applications
|
Yang, Zhenlin |
|
2000 |
40 |
6 |
p. 1051-1059 9 p. |
artikel |
19 |
Properties of laser cut LTCC heaters
|
Kita, Jaroslaw |
|
2000 |
40 |
6 |
p. 1005-1010 6 p. |
artikel |
20 |
Second-layer polysilicon structures for gate end-around leakage-current compensation in bulk CMOS ICs
|
Fouts, Douglas J |
|
2000 |
40 |
6 |
p. 955-963 9 p. |
artikel |
21 |
The evolution of the resistance of aluminum interconnects during electromigration
|
Doan, Jonathan C. |
|
2000 |
40 |
6 |
p. 981-990 10 p. |
artikel |
22 |
Validation of bulk-charge effect parameter extraction in MOSFETs
|
Garcı́a Sánchez, F.J |
|
2000 |
40 |
6 |
p. 941-945 5 p. |
artikel |