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Journal description
All volumes of the corresponding journal
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Details for article 22 of 22 found articles
| Title: |
Validation of bulk-charge effect parameter extraction in MOSFETs |
| Author: |
Garcı́a Sánchez, F.J Ortiz-Conde, A Salcedo, J.A Muci, J Estrada, M Cerdeira, A Liou, J.J Yue, Y |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 6 pages 5 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 22 found articles
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