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Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design |
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Titel: |
Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design |
Auteur: |
Takeda, Eiji Watanabe, Takao Kimura, Shinichiro Yugami, Jiro Haraguchi, Keiichi Suzuki, Kei Sasaki, Katsuro |
Verschenen in: |
Microelectronics reliability |
Paginering: |
Jaargang 40 (2000) nr. 6 pagina's 12 p. |
Jaar: |
2000 |
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Uitgever: |
Elsevier Science Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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