| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
An efficient approach to the measurement and characterization of MOSFET capacitances
|
Sadowski, M
|
|
2000
|
40 |
6 |
p. 1045-1049
5 p.
|
article
|
| 2 |
A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures
|
Bing, Xie
|
|
2000
|
40 |
6 |
p. 1039-1043
5 p.
|
article
|
| 3 |
Backside probing of flip–chip circuits using electrostatic force sampling
|
Qi, R
|
|
2000
|
40 |
6 |
p. 997-1003
7 p.
|
article
|
| 4 |
Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit
|
Maouad, A
|
|
2000
|
40 |
6 |
p. 973-979
7 p.
|
article
|
| 5 |
Comments on “Reliability and component importance of a consecutive-k-out-of-n system” by Zuo
|
Hwang, Frank K.
|
|
2000
|
40 |
6 |
p. 1061-1063
3 p.
|
article
|
| 6 |
Computationally efficient large-change statistical analysis of linear electronic circuits
|
Ilić, T.
|
|
2000
|
40 |
6 |
p. 1023-1038
16 p.
|
article
|
| 7 |
Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design
|
Takeda, Eiji
|
|
2000
|
40 |
6 |
p. 897-908
12 p.
|
article
|
| 8 |
Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
|
Mouthaan, A.J
|
|
2000
|
40 |
6 |
p. 909-917
9 p.
|
article
|
| 9 |
Design-for-test for Digital ICs and Embedded Core Systems; Alfred L. Crouch. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, hardcover, p. 349, CD ROM included, ISBN: 0-13-084827-1, $80,50.
|
Stojcev, M
|
|
2000
|
40 |
6 |
p. 1065-
1 p.
|
article
|
| 10 |
Electrical stress and plasma-induced traps in SiO2
|
Paskaleva, A.
|
|
2000
|
40 |
6 |
p. 933-940
8 p.
|
article
|
| 11 |
High performance a-Si:H thin film transistors based on aluminum gate metallization
|
Nathan, A
|
|
2000
|
40 |
6 |
p. 947-953
7 p.
|
article
|
| 12 |
High Performance Cluster Computing vol. I & II; Rajkumar Buyya ed. Prentice Hall PTR, Upper Saddle River, NJ 07458, 1999, Hardcover, vol. I. p. 849, $55.50, vol. II, p. 664, $55.50, ISBN: 0-13-013784-7 for vol. I, 0-13-013785-5 for vol. II
|
Stojcev, M
|
|
2000
|
40 |
6 |
p. 1066-1067
2 p.
|
article
|
| 13 |
Logic and Computer Design Fundamentals; 2 ed.; Morris Mans, Charles Kime. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, 2000, paperbound, p. 652, CD ROMs included, ISBN: 0-13-016176-4, $48.99.
|
Stojcev, M
|
|
2000
|
40 |
6 |
p. 1065-1066
2 p.
|
article
|
| 14 |
Mechanisms of noise sources in microelectromechanical systems
|
Djurić, Zoran
|
|
2000
|
40 |
6 |
p. 919-932
14 p.
|
article
|
| 15 |
Modeling early failure in integrated circuit interconnect
|
Tekleab, Daniel
|
|
2000
|
40 |
6 |
p. 991-996
6 p.
|
article
|
| 16 |
Module allocation for on-line testing
|
Ismaeel, A.A
|
|
2000
|
40 |
6 |
p. 1011-1021
11 p.
|
article
|
| 17 |
New challenges to the modelling and electrical characterisation of ohmic contacts for ULSI devices
|
Holland, A.S
|
|
2000
|
40 |
6 |
p. 965-971
7 p.
|
article
|
| 18 |
Predictive densities for the lognormal distribution and their applications
|
Yang, Zhenlin
|
|
2000
|
40 |
6 |
p. 1051-1059
9 p.
|
article
|
| 19 |
Properties of laser cut LTCC heaters
|
Kita, Jaroslaw
|
|
2000
|
40 |
6 |
p. 1005-1010
6 p.
|
article
|
| 20 |
Second-layer polysilicon structures for gate end-around leakage-current compensation in bulk CMOS ICs
|
Fouts, Douglas J
|
|
2000
|
40 |
6 |
p. 955-963
9 p.
|
article
|
| 21 |
The evolution of the resistance of aluminum interconnects during electromigration
|
Doan, Jonathan C.
|
|
2000
|
40 |
6 |
p. 981-990
10 p.
|
article
|
| 22 |
Validation of bulk-charge effect parameter extraction in MOSFETs
|
Garcı́a Sánchez, F.J
|
|
2000
|
40 |
6 |
p. 941-945
5 p.
|
article
|
Journal description