Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Analyzing the impact of soft errors in VGG networks implemented on GPUs Wei, Jinghe

110 C p.
artikel
2 Comparison study of gold coatings prepared by traditional and modified galvanic replacement deposition for corrosion prevention of copper Zhang, Xingkai

110 C p.
artikel
3 CSTBT™ technology for high voltage applications with high dynamic robustness and low overall loss Nakamura, Katsumi

110 C p.
artikel
4 Defect inspection of flip chip solder joints based on non-destructive methods: A review Su, Lei

110 C p.
artikel
5 Editorial Board
110 C p.
artikel
6 Failure mechanism of lead-free component boards in thermomechanical test based on recrystallization enhanced cracking Xu, Hongbo

110 C p.
artikel
7 Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor Djeziri, M.A.

110 C p.
artikel
8 High-energy proton irradiation effects on GaN hybrid-drain-embedded gate injection transistors Floriduz, Alessandro

110 C p.
artikel
9 In-situ service load monitoring of automotive electronic systems using silicon-based piezoresistive stress sensor Yang, Yu-Hsiang

110 C p.
artikel
10 Mechanical integrity of back-end-of-line with Ru nanowires and airgaps Zahedmanesh, Houman

110 C p.
artikel
11 Microstructure evolution and hardness of MWCNT-reinforced Sn-5Sb/Cu composite solder joints under different thermal aging conditions Dele-Afolabi, T.T.

110 C p.
artikel
12 Minimum voltage control for reliability improvement in modular multilevel cascade converters-based STATCOM de Sousa, R.O.

110 C p.
artikel
13 Modeling and analysis of mesh pattern influences on DBC thermal cycling reliability Han, Lubin

110 C p.
artikel
14 Modelling and analysis of vibration on power electronic module structure and application of model order reduction Rajaguru, Pushpa

110 C p.
artikel
15 Monitoring of defects creation sequence in 808 nm laser diode by reflectance analysis Hao, Tieying

110 C p.
artikel
16 Performance of SiC cascode JFETs under single and repetitive avalanche pulses Agbo, S.N.

110 C p.
artikel
17 Printed wire assembly HASS profile development based on HALT Awad, Mahmoud I.

110 C p.
artikel
18 Pursuing computationally efficient wear-out prediction of PV inverters: The role of the mission profile resolution Silva, R.P.

110 C p.
artikel
19 Recovery investigation of NBTI-induced traps in n-MOSFET devices Djezzar, Boualem

110 C p.
artikel
20 Relative effectiveness of high-k passivation and gate-connected field plate techniques in enhancing GaN HEMT breakdown Prasannanjaneyulu, Bhavana

110 C p.
artikel
21 Research of single-event burnout and hardened GaN MISFET with embedded PN junction Fei, Xin-Xing

110 C p.
artikel
22 Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment Malagón, Daniel

110 C p.
artikel
23 Stable and reliable ohmic contact on p-type 4H-SiC up to 1500 h of aging at 600 °C Abou Hamad, Valdemar

110 C p.
artikel
24 Three-phase SiC inverter with active limitation of all MOSFETs junction temperature Stella, Fausto

110 C p.
artikel
                             24 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland