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                             25 results found
no title author magazine year volume issue page(s) type
1 Analysis of breakdown voltage for GaN MIS-HEMT with various composite field plate configurations and passivation layers Langpoklakpam, Catherine

216 C p.
article
2 Analysis of electrical and hysteresis characteristics of flexible OTFT using solution-processable DPP-DTT polymer and Parylene-C Ko, Yoojeong

216 C p.
article
3 Analysis of ferroelectric properties of ALD-Hf0.5Zr0.5O2 thin films according to oxygen sources Lee, Seungbin

216 C p.
article
4 Analysis of Mechanical Stress on Fowler-Nordheim Tunneling for Program Operation in 3D NAND Flash Memory Kim, Donghyun

216 C p.
article
5 Analysis of metal and zinc oxide semiconductor interface resistance using transmission line method Lee, Do-Yeon

216 C p.
article
6 An ultra low power spiking neural encoder of microwave signals Loyez, Christophe

216 C p.
article
7 A single neural network global I-V and C-V parameter extractor for BSIM-CMG compact model Chen, Jen-Hao

216 C p.
article
8 A wireless neural recording microsystem with operator-based spike detection Lim, Joonyoung

216 C p.
article
9 A wireless stimulator system-on-chip with an optically writable ID for addressable cortical microimplants Lee, Chae-Eun

216 C p.
article
10 BCl3/Cl2 plasma etching process to fabricate a ferroelectric gate structure for device integration Kang, Bohyeon

216 C p.
article
11 Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices Yun, Jiyeong

216 C p.
article
12 Demonstration of bias scheme for ferroelectric field-effect transistor (FeFET) based AND array operation Kim, Shinhee

216 C p.
article
13 Editorial Board
216 C p.
article
14 Impact of JFET width on conduction characteristic for p-channel SiC IGBT Xu, Kunhui

216 C p.
article
15 Impact of work function metal stacks on the performance and reliability of multi-Vth RMG CMOS technology Franco, J.

216 C p.
article
16 Improvement of instrumentation consistency using DUV filter in Spectroscopic Ellipsometry Gim, Yu-Seong

216 C p.
article
17 Influence of RF power in the sputter deposition of amorphous InGaZnO film on the transient drain current of amorphous InGaZnO thin-film transistors Lee, Da Yeon

216 C p.
article
18 Multi-level storage in cleaved-gate ferroelectric FETs investigated by 3D phase-field-based quantum transport simulation Jang, Jeonghwan

216 C p.
article
19 NO2 gas response improvement method by adopting oxygen vacancy controlled In2O3 double sensing layers Choi, Kangwook

216 C p.
article
20 Performance improvement of multilayered ZnO/SnO2 thin-film transistors by varying supercycles and growth temperatures Park, Chan-Yeong

216 C p.
article
21 Pinning voltage model of vertical pinned photodiode for Dual-Pixel image sensor Ahn, Hyeon Soo

216 C p.
article
22 Proposed package type for evaluating reliability of HBM Memory Lee, Dongsoo

216 C p.
article
23 Theoretical study of extreme ultraviolet pellicles with nanometer thicknesses Kim, Sang-Kon

216 C p.
article
24 Top-gate thin-film transistors with amorphous ZnSnO channel layers prepared by pulsed plasma deposition Lan, Yue

216 C p.
article
25 Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs Singh, Khoirom Johnson

216 C p.
article
                             25 results found
 
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