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                             30 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A fully integrated half-bridge driver circuit in All-GaN GAN-IC technology Chatterjee, Urmimala

207 C p.
artikel
2 Amorphous GaOx based charge trap memory device for neuromorphic applications Van Dijck, C.

207 C p.
artikel
3 An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs Fernandez, Julian G.

207 C p.
artikel
4 Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack Yan, Yiyi

207 C p.
artikel
5 Analytical modeling of negative capacitance transistor based ultra low power Schmitt trigger Keerthi, Guntupalli

207 C p.
artikel
6 An eco-friendly bandgap engineering of semiconductor graphene oxide Cruz Salazar, Y.

207 C p.
artikel
7 A novel substrate Voltage-assisted RESURF technique in SOI LDMOS with a heavily doped drift region Li, Man

207 C p.
artikel
8 Assessment of a universal logic gate and a full adder circuit based on CMOS-memristor technology Guitarra, S.

207 C p.
artikel
9 Bipolar nonlinear photo-controlled thyristor with variable-resistance effect Wang, Yang

207 C p.
artikel
10 Compact I-V model for back-gated and double-gated TMD FETs Mounir, Ahmed

207 C p.
artikel
11 Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures Roemer, Christian

207 C p.
artikel
12 Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs Halder, Arka

207 C p.
artikel
13 Corrigendum to “In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets” [Solid-State Electron. 201(2023) 10859] Cretu, B.

207 C p.
artikel
14 3D backside integration of FinFETs: Is there an impact on LF noise? Simoen, Eddy

207 C p.
artikel
15 Editorial Board
207 C p.
artikel
16 Experimental analysis of variability in WS2-based devices for hardware security Vatalaro, M.

207 C p.
artikel
17 Exploitation of OTFTs variability for PUFs implementation and impact of aging Claramunt, S.

207 C p.
artikel
18 High-k/InGaAs interface defects at cryogenic temperature Cherkaoui, K.

207 C p.
artikel
19 Impact of the W etching process on the resistive switching properties of TiN/Ti/HfO2/W memristors Saludes-Tapia, M.

207 C p.
artikel
20 Improved self-heating extraction with RF technique at cryogenic temperatures Vanbrabant, Martin

207 C p.
artikel
21 Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques Asanovski, Ruben

207 C p.
artikel
22 Liquid-gate 2D material-on-insulator transistors for sensing applications Marquez, Carlos

207 C p.
artikel
23 Massively parallel FDTD-FBMC simulations of nonlinear hole dynamics in silicon at cryogenic temperatures driven by intense EM THz pulses Jungemann, C.

207 C p.
artikel
24 Reliability characterization of non-hysteretic charge amplification in MFIM device Engl, Moritz

207 C p.
artikel
25 Role of interface and bulk traps on the capacitance–voltage characteristics of WS2/Al2O3/Si capacitors Intonti, Kimberly

207 C p.
artikel
26 Role of interface/border traps on the threshold voltage instability of SiC power transistors Volosov, V.

207 C p.
artikel
27 Schottky barrier diode consisting of van der Waals heterojunction of MoS2 film and PtCoO2 contact Urakami, Noriyuki

207 C p.
artikel
28 Steep subthreshold slope “Dual-gate PN-body tied SOI-FET” – First fabrication results – Yonezaki, Haruki

207 C p.
artikel
29 TCAD assisted design of the Doherty Power Amplifier Donati Guerrieri, Simona

207 C p.
artikel
30 Ultra-low turn-on voltage quasi-vertical GaN Schottky barrier diode with homogeneous barrier height Lin, Ya-Xun

207 C p.
artikel
                             30 gevonden resultaten
 
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