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                             30 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A new technical solution to the problem of increasing the resolution of X-ray diffraction methods Drmeyan, H. R.

58 1 p. 71-75
artikel
2 An extended thermal pressure equation of state for sodium fluoride Clough, Lewis A.

58 1 p. 227-232
artikel
3 Application of signal separation to diffraction image compression and serial crystallography Kieffer, Jérôme

58 1 p. 138-153
artikel
4 ASUGNN: an asymmetric-unit-based graph neural network for crystal property prediction Cao, Barnie

58 1 p. 87-95
artikel
5 Bias caused by a popular weighting scheme Henn, Julian

58 1 p. 283-289
artikel
6 Calculation of pair distribution functions from small-angle X-ray scattering protein data by direct transform Badger, John

58 1 p. 119-127
artikel
7 Characterization and calibration of DECTRIS PILATUS3 X CdTe 2M high-Z hybrid pixel detector for high-precision powder diffraction measurements Vaughan, Gavin B. M.

58 1 p. 76-86
artikel
8 Counter-diffusion studies of human transthyretin: the growth of high-quality crystals for X-ray and neutron crystallography De'Ath, Clare

58 1 p. 107-118
artikel
9 crystchemlib: a Python library and GUI for analysis of crystal structure datasets Rashchenko, Sergey V.

58 1 p. 290-295
artikel
10 Effect of thickness and noise on angular correlation analysis from scanning electron nanobeam diffraction of disordered carbon Klemmt, Rebekka

58 1 p. 31-41
artikel
11 Error evaluation of partial scattering functions obtained from contrast-variation small-angle neutron scattering Mayumi, Koichi

58 1 p. 4-17
artikel
12 First-principles calculations of quartz–coesite interfaces Schaffrinna, Tim

58 1 p. 180-186
artikel
13 High-accuracy high-resolution measurements of fluorescence in manganese using extended-range high-energy-resolution fluorescence detection Sier, Daniel

58 1 p. 42-59
artikel
14 hkl-based calculation of total scattering patterns from discrete and low-dimensional structure models using TOPAS Mesecke, Karsten

58 1 p. 187-193
artikel
15 Hydrostatic behaviour of highly inert Fomblin and Halocarbon fluids as pressure-transmitting media in high-pressure experiments Motaln, Klemen

58 1 p. 221-226
artikel
16 Integrating fundamental concepts with practical skills: consolidating small-molecule crystallography education Zheng, Shao-Liang

58 1 p. 269-275
artikel
17 Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors Gasser, Fabian

58 1 p. 96-106
artikel
18 iPowder: advanced software for automated high-throughput X-ray diffraction analysis Chang, Shihui

58 1 p. 296-301
artikel
19 Journal of Applied Crystallography welcomes eight new Co-editors Hajdu, Janos

58 1 p. 1-3
artikel
20 Measuring the Burgers vector of dislocations with dark-field X-ray microscopy Pal, Dayeeta

58 1 p. 207-220
artikel
21 Method of precise optical crystal alignment by tilting the diamond anvil cell Rusanov, Eduard B.

58 1 p. 251-259
artikel
22 Microcalcifications in breast cancer tissue studied by X-ray absorption, emission, scattering and diffraction Huthwelker, Thomas

58 1 p. 233-250
artikel
23 New robotic tools for multimodal non-destructive analysis and characterization of 2D and 3D objects Kotrlý, Marek

58 1 p. 168-179
artikel
24 Reciprocal-space mapping calculations of X-ray Laue diffraction in a crystal with thermomigration channels Punegov, Vasily

58 1 p. 260-268
artikel
25 Residual stress depth profiling based on a triaxial stress model: the principal stress gradients in magnetron-sputtered molybdenum films Schoderböck, Peter

58 1 p. 60-70
artikel
26 Simulation of bent Laue crystals for a high-energy X-ray monochromator with heat load consideration Wang, Jiayi

58 1 p. 154-167
artikel
27 Studying novel high-pressure phases in laser-shock-affected silicon using poly: an algorithm for spot-wise phase identification Doostkam, Rasool

58 1 p. 128-137
artikel
28 Theoretical investigation of adsorptive nitrate ion removal by pure graphene, Mo-decorated graphene and reduced graphene oxide based adsorbents: a DFT study Mohseninia, Nazanin

58 1 p. 194-206
artikel
29 Thermal diffuse scattering analysis of Ag2O binary system via X-ray powder diffraction Malagutti, Marcelo Augusto

58 1 p. 18-30
artikel
30 Top dusted adhesive tape sample preparation method for the X-ray diffraction analysis of small powder sample volumes with the Bragg–Brentano setup Dickes, Daniel

58 1 p. 276-282
artikel
                             30 gevonden resultaten
 
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