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Effect of thickness and noise on angular correlation analysis from scanning electron nanobeam diffraction of disordered carbon |
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Titel: |
Effect of thickness and noise on angular correlation analysis from scanning electron nanobeam diffraction of disordered carbon |
Auteur: |
Klemmt, Rebekka Liu, Amelia C. Y. Hu, Cheng Biggs, Mark J. Petersen, Timothy C. Bøjesen, Espen D. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 58 () nr. 1 pagina's 31-41 |
Jaar: |
2025-02-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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