nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing
|
Bergenholtz, Johan |
|
2016 |
49 |
1 |
p. 47-54 |
artikel |
2 |
Analysis of stresses and crystal structure in the surface layer of hexagonal polycrystalline materials: a new methodology based on grazing incidence diffraction
|
Marciszko, Marianna |
|
2016 |
49 |
1 |
p. 85-102 |
artikel |
3 |
A novel high-throughput setup for in situ powder diffraction on coin cell batteries
|
Herklotz, Markus |
|
2016 |
49 |
1 |
p. 340-345 |
artikel |
4 |
A portable general-purpose application programming interface for CIF 2.0
|
Bollinger, John C. |
|
2016 |
49 |
1 |
p. 285-291 |
artikel |
5 |
Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays
|
Send, Sebastian |
|
2016 |
49 |
1 |
p. 222-233 |
artikel |
6 |
A program for refinement of lattice parameters and strain determination using Kossel diffraction patterns
|
Morawiec, A. |
|
2016 |
49 |
1 |
p. 322-329 |
artikel |
7 |
A-site order in rhombohedral perovskite-like oxides La2−xSrxCoTiO6 (0.6 ≤ x ≤ 1.0)
|
Gómez-Pérez, Alejandro |
|
2016 |
49 |
1 |
p. 31-39 |
artikel |
8 |
Aurore: new software for neutron reflectivity data analysis
|
Gerelli, Yuri |
|
2016 |
49 |
1 |
p. 330-339 |
artikel |
9 |
A visible-light-excited fluorescence method for imaging protein crystals without added dyes
|
Lukk, Tiit |
|
2016 |
49 |
1 |
p. 234-240 |
artikel |
10 |
Caution regarding ambiguities in similar expressions of orientation relationships
|
Du, Juan |
|
2016 |
49 |
1 |
p. 40-46 |
artikel |
11 |
CHARDI2015: charge distribution analysis of non-molecular structures
|
Nespolo, Massimo |
|
2016 |
49 |
1 |
p. 317-321 |
artikel |
12 |
COD::CIF::Parser: an error-correcting CIF parser for the Perl language
|
Merkys, Andrius |
|
2016 |
49 |
1 |
p. 292-301 |
artikel |
13 |
CONRAD-2: the new neutron imaging instrument at the Helmholtz-Zentrum Berlin
|
Kardjilov, Nikolay |
|
2016 |
49 |
1 |
p. 195-202 |
artikel |
14 |
Diffraction tomography and Rietveld refinement of a hydroxyapatite bone phantom
|
Frølich, S. |
|
2016 |
49 |
1 |
p. 103-109 |
artikel |
15 |
EBSD study of the morphology and orientation of the primary and eutectic phases in Al–Cu alloys during solidification under a strong magnetic field
|
Li, Xi |
|
2016 |
49 |
1 |
p. 139-148 |
artikel |
16 |
Extension of the sasCIF format and its applications for data processing and deposition
|
Kachala, Michael |
|
2016 |
49 |
1 |
p. 302-310 |
artikel |
17 |
High-temperature dynamic octahedral tilting in the ionic conductor Sr11Mo4O23
|
López, Carlos A. |
|
2016 |
49 |
1 |
p. 78-84 |
artikel |
18 |
Improvement in X-ray stress measurement using Debye–Scherrer rings by in-plane averaging
|
Miyazaki, Toshiyuki |
|
2016 |
49 |
1 |
p. 241-249 |
artikel |
19 |
Low-temperature powder X-ray diffraction measurements in vacuum: analysis of the thermal displacement of copper
|
Wahlberg, Nanna |
|
2016 |
49 |
1 |
p. 110-119 |
artikel |
20 |
Misfit-induced changes of lattice parameters in two-phase systems: coherent/incoherent precipitates in a matrix
|
Akhlaghi, Maryam |
|
2016 |
49 |
1 |
p. 69-77 |
artikel |
21 |
Monte Carlo X-ray transport simulation of small-angle X-ray scattering instruments using measured sample cross sections
|
Choi, Mina |
|
2016 |
49 |
1 |
p. 188-194 |
artikel |
22 |
Morphology control of BiFeO3 aggregates via hydrothermal synthesis
|
Suzuki, Kazumasa |
|
2016 |
49 |
1 |
p. 168-174 |
artikel |
23 |
Multi-tube area detector developed for reactor small-angle neutron scattering spectrometer SANS-J-II
|
Noda, Y. |
|
2016 |
49 |
1 |
p. 128-138 |
artikel |
24 |
Online data analysis at the ESRF bioSAXS beamline, BM29
|
Brennich, Martha Elisabeth |
|
2016 |
49 |
1 |
p. 203-212 |
artikel |
25 |
Phase diagram of the Nd2Fe14B–Sm2Fe14B pseudo-binary system
|
Xu, Ch. F. |
|
2016 |
49 |
1 |
p. 64-68 |
artikel |
26 |
Phononic Crystals. By Vincent Laude. De Gruyter, 2015. Pp. XII+427. Price (hardcover) Euro 139.95, USD 196.00, GBP 104.99. ISBN 978-3-11-030265-3.
|
Akimov, Andrey V. |
|
2016 |
49 |
1 |
p. 346-347 |
artikel |
27 |
Pressure-induced polymorphism in nanostructured SnSe
|
Michielon de Souza, Sergio |
|
2016 |
49 |
1 |
p. 213-221 |
artikel |
28 |
Probing the absolute scattering intensity by means of a laboratory-based small-angle X-ray scattering camera using an imaging plate detector
|
Gutsche, Alexander |
|
2016 |
49 |
1 |
p. 15-23 |
artikel |
29 |
RaDMaX: a graphical program for the determination of strain and damage profiles in irradiated crystals
|
Souilah, M. |
|
2016 |
49 |
1 |
p. 311-316 |
artikel |
30 |
Reduction of lattice disorder in protein crystals by high-pressure cryocooling
|
Huang, Qingqiu |
|
2016 |
49 |
1 |
p. 149-157 |
artikel |
31 |
Relationship between the volume of the unit cell of hexagonal-close-packed Ti, hardness and oxygen content after α-case formation in Ti–6Al–2Sn–4Zr–2Mo–0.1Si alloy
|
Baillieux, J. |
|
2016 |
49 |
1 |
p. 175-181 |
artikel |
32 |
SENJU: a new time-of-flight single-crystal neutron diffractometer at J-PARC
|
Ohhara, Takashi |
|
2016 |
49 |
1 |
p. 120-127 |
artikel |
33 |
Size and shape of graphene layers in commercial carbon blacks established by Debye refinement
|
Andreev, Yuri G. |
|
2016 |
49 |
1 |
p. 24-30 |
artikel |
34 |
Small-angle scattering behavior of thread-like and film-like systems
|
Ciccariello, Salvino |
|
2016 |
49 |
1 |
p. 260-276 |
artikel |
35 |
Specification of the Crystallographic Information File format, version 2.0
|
Bernstein, Herbert J. |
|
2016 |
49 |
1 |
p. 277-284 |
artikel |
36 |
Spherical polar Fourier assembly of protein complexes with arbitrary point group symmetry
|
Ritchie, David W. |
|
2016 |
49 |
1 |
p. 158-167 |
artikel |
37 |
Spin echo modulated small-angle neutron scattering using superconducting magnetic Wollaston prisms
|
Li, Fankang |
|
2016 |
49 |
1 |
p. 55-63 |
artikel |
38 |
The small-angle neutron scattering instrument D33 at the Institut Laue–Langevin
|
Dewhurst, C. D. |
|
2016 |
49 |
1 |
p. 1-14 |
artikel |
39 |
X-ray asterism and the structure of cracks from indentations in silicon
|
Tanner, B. K. |
|
2016 |
49 |
1 |
p. 250-259 |
artikel |
40 |
X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
|
Todt, J. |
|
2016 |
49 |
1 |
p. 182-187 |
artikel |