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                             56 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Advances in in situ powder diffraction of battery materials: a case study of the new beamline P02.1 at DESY, Hamburg Herklotz, Markus
2013
46 4 p. 1117-1127
artikel
2 Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B Davydok, Anton
2013
46 4 p. 893-897
artikel
3 A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS Suturin, S. M.
2013
46 4 p. 874-881
artikel
4 An accidental visualization of the Brillouin zone in an Ni–W alloy via diffuse scattering Maisel, Sascha B.
2013
46 4 p. 1211-1215
artikel
5 A new mechanism of anionic substitution in fluoride borates Rashchenko, Sergey V.
2013
46 4 p. 1081-1084
artikel
6 A novel small-angle neutron scattering detector geometry Kanaki, Kalliopi
2013
46 4 p. 1031-1037
artikel
7 Application of immune and genetic algorithms to the identification of a polymer based on its X-ray diffraction curve Rabiej, Małgorzata
2013
46 4 p. 1136-1144
artikel
8 Approximation of the structure factor for nonspherical hard bodies using polydisperse spheres Hansen, Steen
2013
46 4 p. 1008-1016
artikel
9 A prototype direct-detection CCD for protein crystallography Green, Katherine S.
2013
46 4 p. 1038-1048
artikel
10 A scanning CCD detector for powder diffraction measurements Toby, B. H.
2013
46 4 p. 1058-1063
artikel
11 Characterization of SiGe thin films using a laboratory X-ray instrument Ulyanenkova, Tatjana
2013
46 4 p. 898-902
artikel
12 Combined X-ray diffraction and solid-state 19F magic angle spinning NMR analysis of lattice defects in nanocrystalline CaF2 Abdellatief, Mahmoud
2013
46 4 p. 1049-1057
artikel
13 Composition-dependent structure of polycrystalline magnetron-sputtered V–Al–C–N hard coatings studied by XRD, XPS, XANES and EXAFS Krause, Bärbel
2013
46 4 p. 1064-1075
artikel
14 Computer studies on reflection high-energy electron diffraction from the growing surface of Ge(001) Mitura, Zbigniew
2013
46 4 p. 1024-1030
artikel
15 Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures Zhylik, A.
2013
46 4 p. 919-925
artikel
16 Crack propagation and fracture in silicon wafers under thermal stress Danilewsky, Andreas
2013
46 4 p. 849-855
artikel
17 CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose Oliveira, Rafael P.
2013
46 4 p. 1196-1210
artikel
18 Defect structure transformation after thermal annealing in a surface layer of Zn-implanted Si(001) substrates Shcherbachev, Kirill
2013
46 4 p. 882-886
artikel
19 Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detector Fertey, Pierre
2013
46 4 p. 1151-1161
artikel
20 Dose optimization approach to fast X-ray microtomography of the lung alveoli Lovric, Goran
2013
46 4 p. 856-860
artikel
21 Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique Ali, Kamran
2013
46 4 p. 908-911
artikel
22 Evolution of order in amorphous-to-crystalline phase transformation of MgF2 Mu, Xiaoke
2013
46 4 p. 1105-1116
artikel
23 EXPO2013: a kit of tools for phasing crystal structures from powder data Altomare, Angela
2013
46 4 p. 1231-1235
artikel
24 GBgeom: a computer program for visualizing texture parameters and simulating grain boundary structures in cubic crystals Karthikeyan, Thangaraj
2013
46 4 p. 1221-1224
artikel
25 Graphene: Carbon in Two Dimensions. By Mikhail I. Katsnelson. Cambridge University Press, 2012. Price (hardcover) GBP 45.00. ISBN-13: 9780521195409. Paufler, Peter
2013
46 4 p. 1240-1241
artikel
26 Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams Bussone, Genziana
2013
46 4 p. 887-892
artikel
27 Heterocyclic and aromatic based polyurethane scaffolds: morphology and crystallinity studied by X-ray diffraction, small-angle X-ray scattering and differential scanning calorimetry Madkour, Tarek M.
2013
46 4 p. 980-992
artikel
28 High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers Hönnicke, Marcelo Goncalves
2013
46 4 p. 939-944
artikel
29 High-resolution X-ray diffraction and imaging Fewster, Paul F.
2013
46 4 p. 841
artikel
30 Identifying multiple forms of lateral disorder in cellulose fibres Thomas, L. H.
2013
46 4 p. 972-979
artikel
31 Improved asymmetric peak parameter refinement Hester, James R.
2013
46 4 p. 1219-1220
artikel
32 In situ X-ray crystallographic study of the structural evolution of colloidal crystals upon heating Zozulya, A. V.
2013
46 4 p. 903-907
artikel
33 Microstructure and interdiffusion behaviour of β-FeSi2 flat islands grown on Si(111) surfaces Cho, Sung-Pyo
2013
46 4 p. 1076-1080
artikel
34 Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures Shreeman, P. K.
2013
46 4 p. 912-918
artikel
35 Nonlinear continuum growth model of multiscale reliefs as applied to rigorous analysis of multilayer short-wave scattering intensity. I. Gratings Goray, Leonid
2013
46 4 p. 926-932
artikel
36 Ordered stacking of crystals with adjustable curvatures for hard X- and γ-ray broadband focusing Neri, Ilaria
2013
46 4 p. 953-959
artikel
37 Pair distribution function analysis of X-ray diffraction from amorphous spheres in an asymmetric transmission geometry: application to a Zr58.5Cu15.6Ni12.8Al10.3Nb2.8 glass Bendert, J. C.
2013
46 4 p. 999-1007
artikel
38 Phase determination of the crystal structure factor by measuring rocking curves from a polar crystal Negishi, Riichirou
2013
46 4 p. 1216-1218
artikel
39 Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging Korytár, D.
2013
46 4 p. 945-952
artikel
40 Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging Zápražný, Zdenko
2013
46 4 p. 933-938
artikel
41 RADDOSE-3D: time- and space-resolved modelling of dose in macromolecular crystallography Zeldin, Oliver B.
2013
46 4 p. 1225-1230
artikel
42 Rapid and accurate calculation of small-angle scattering profiles using the golden ratio Watson, Max C.
2013
46 4 p. 1171-1177
artikel
43 Relationship between performance and microvoids of aramid fibers revealed by two-dimensional small-angle X-ray scattering Zhu, Caizhen
2013
46 4 p. 1178-1186
artikel
44 Representative reduction of crystallographic orientation data Jöchen, Katja
2013
46 4 p. 960-971
artikel
45 Safety interlock and vent system to alleviate potentially dangerous ice blockage of top-loading cryostat sample sticks Pangelis, S.
2013
46 4 p. 1236-1239
artikel
46 SASET: a program for series analysis of small-angle scattering data Muthig, Michael
2013
46 4 p. 1187-1195
artikel
47 Solving complex open-framework structures from X-ray powder diffraction by direct-space methods using composite building units Inge, A. Ken
2013
46 4 p. 1094-1104
artikel
48 Symmetry-mode analysis of the phase transitions in SrLaZnRuO6 and SrLaMgRuO6 ordered double perovskites Iturbe-Zabalo, E.
2013
46 4 p. 1085-1093
artikel
49 Three-dimensional rocking curve imaging to measure the effective distortion in the neighbourhood of a defect within a crystal: an ice example Philip, Armelle
2013
46 4 p. 842-848
artikel
50 Three-wave X-ray diffraction in distorted epitaxial structures Kyutt, Reginald
2013
46 4 p. 861-867
artikel
51 Tunnel-dependent supercapacitance of MnO2: effects of crystal structure Sun, Congting
2013
46 4 p. 1128-1135
artikel
52 Unidirectional growth and characterization of L-tartaric acid single crystals Moovendaran, K.
2013
46 4 p. 993-998
artikel
53 Using FOCUS to solve zeolite structures from three-dimensional electron diffraction data Smeets, Stef
2013
46 4 p. 1017-1023
artikel
54 Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization Syha, Melanie
2013
46 4 p. 1145-1150
artikel
55 X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substrates Zaumseil, Peter
2013
46 4 p. 868-873
artikel
56 xrayutilities: a versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors Kriegner, Dominik
2013
46 4 p. 1162-1170
artikel
                             56 gevonden resultaten
 
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