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Details for article 18 of 56 found articles
| Title: |
Defect structure transformation after thermal annealing in a surface layer of Zn-implanted Si(001) substrates |
| Author: |
Shcherbachev, Kirill Privezentsev, Vladimir Kulikauskas, Vaclav Zatekin, Vladimir Saraykin, Vladimir |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 4 pages 882-886 |
| Year: |
2013-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 56 found articles
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