| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Crystallographic Information File for specular reflectivity data
|
|
|
2006
|
39 |
3 |
p. 468
|
artikel
|
| 2 |
A deconvolution method for the reconstruction of underlying profiles measured using large sampling volumes
|
Xiong, Y.-S.
|
|
2006
|
39 |
3 |
p. 410-424
|
artikel
|
| 3 |
A direct method for the determination of the mean orientation-dependent elastic strains and stresses in polycrystalline materials from strain pole figures
|
Bernier, Joel V.
|
|
2006
|
39 |
3 |
p. 358-368
|
artikel
|
| 4 |
A program for automated optimization of initial crystallization conditions
|
Ben Haj Abdellatif, Tahia
|
|
2006
|
39 |
3 |
p. 446-452
|
artikel
|
| 5 |
Calculation of the instrumental function in X-ray powder diffraction
|
Zuev, A. D.
|
|
2006
|
39 |
3 |
p. 304-314
|
artikel
|
| 6 |
Characterization of insulin microcrystals using powder diffraction and multivariate data analysis
|
Norrman, Mathias
|
|
2006
|
39 |
3 |
p. 391-400
|
artikel
|
| 7 |
Geometrical parameterization of the crystal chemistry of P63/m apatite. II. Precision, accuracy and numerical stability of the crystal-chemical Rietveld refinement
|
Mercier, Patrick H. J.
|
|
2006
|
39 |
3 |
p. 369-375
|
artikel
|
| 8 |
Grazing-incidence small-angle X-ray scattering from thin polymer films with lamellar structures – the scattering cross section in the distorted-wave Born approximation
|
Busch, P.
|
|
2006
|
39 |
3 |
p. 433-442
|
artikel
|
| 9 |
Measurement of stress/strain in single-crystal samples using diffraction
|
Yan, Hanfei
|
|
2006
|
39 |
3 |
p. 320-325
|
artikel
|
| 10 |
Mercury: visualization and analysis of crystal structures
|
Edgington, Paul R.
|
|
2006
|
39 |
3 |
p. 453-457
|
artikel
|
| 11 |
Method of separated form factors for polydisperse vesicles
|
Pencer, Jeremy
|
|
2006
|
39 |
3 |
p. 293-303
|
artikel
|
| 12 |
Microstructural analysis of integrated pin-shaped two-dimensional and three-dimensional ferroelectric capacitors from micro-focused synchrotron X-ray techniques
|
Menou, N.
|
|
2006
|
39 |
3 |
p. 376-384
|
artikel
|
| 13 |
Ripple: a program to collect and analyze digital topographic sequences
|
Lovelace, Jeffrey J.
|
|
2006
|
39 |
3 |
p. 466-467
|
artikel
|
| 14 |
Simple procedure for conformation-family search in multidimensional torsion-angle space
|
Pavelcik, Frantisek
|
|
2006
|
39 |
3 |
p. 315-319
|
artikel
|
| 15 |
Si wafers having one- and two-dimensionally curved (111) planes examined by X-ray diffraction
|
Okuda, Hiroshi
|
|
2006
|
39 |
3 |
p. 443-445
|
artikel
|
| 16 |
Structural and microstructural characterization of bioapatites and synthetic hydroxyapatite using X-ray powder diffraction and Fourier transform infrared techniques
|
Chakraborty, Santu
|
|
2006
|
39 |
3 |
p. 385-390
|
artikel
|
| 17 |
SVDdiagnostic, a program to diagnose numerical conditioning of Rietveld refinements
|
Mercier, Patrick H. J.
|
|
2006
|
39 |
3 |
p. 458-465
|
artikel
|
| 18 |
Symmetry properties and transformation behaviour of the X-ray stress factors
|
Ortner, Balder
|
|
2006
|
39 |
3 |
p. 401-409
|
artikel
|
| 19 |
The determination of pore volumes, pore shapes and diffusion paths in microporous crystals
|
Küppers, Horst
|
|
2006
|
39 |
3 |
p. 338-346
|
artikel
|
| 20 |
The instrumental resolution function of synchrotron radiation powder diffractometers in the presence of focusing optics
|
Gozzo, Fabia
|
|
2006
|
39 |
3 |
p. 347-357
|
artikel
|
| 21 |
Three-dimensional birefringence imaging with a microscope tilting-stage. I. Uniaxial crystals
|
Pajdzik, L. A.
|
|
2006
|
39 |
3 |
p. 326-337
|
artikel
|
| 22 |
Tracking reflections through cryogenic cooling with topography
|
Lovelace, Jeffrey J.
|
|
2006
|
39 |
3 |
p. 425-432
|
artikel
|
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