Microstructural analysis of integrated pin-shaped two-dimensional and three-dimensional ferroelectric capacitors from micro-focused synchrotron X-ray techniques
Titel:
Microstructural analysis of integrated pin-shaped two-dimensional and three-dimensional ferroelectric capacitors from micro-focused synchrotron X-ray techniques
Auteur:
Menou, N. Muller, Ch. Goux, L. Barrett, R. Lisoni, J. G. Schwitters, M. Wouters, D. J.
Verschenen in:
Applied crystallography online
Paginering:
Jaargang 39 (2006) nr. 3 pagina's 376-384
Jaar:
2006-06-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England